Search Results for Scanning. - Narrowed by: Atomic force microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dScanning.$0026qf$003dSUBJECT$002509Subject$002509Atomic$002bforce$002bmicroscopy.$002509Atomic$002bforce$002bmicroscopy.$0026ps$003d300?2024-11-06T11:42:15ZElectrochemical nanotechnology in-situ local probe techniques at electrochemical interfacesent://SD_ILS/0/SD_ILS:3006422024-11-06T11:42:15Z2024-11-06T11:42:15ZAuthor Lorenz, W. J. Plieth, W. (Waldfried) International Union of Pure and Applied Chemistry. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=481756</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527612154">http://dx.doi.org/10.1002/9783527612154</a>
HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/39117390.html">http://catalog.hathitrust.org/api/volumes/oclc/39117390.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Surface analysis with STM and AFM experimental and theoretical aspects of image analysisent://SD_ILS/0/SD_ILS:3007382024-11-06T11:42:15Z2024-11-06T11:42:15ZAuthor Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527615117">http://dx.doi.org/10.1002/9783527615117</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>