Search Results for Sekundärionen-Massenspektrometrie. - Narrowed by: Electronic Library
SirsiDynix Enterprise
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2024-09-13T21:08:10Z
Ion beams for materials analysis
ent://SD_ILS/0/SD_ILS:256241
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2024-09-13T21:08:10Z
Author Bird, J. R. Williams, James S. (James Stanislaus), 1948-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120997404">http://www.sciencedirect.com/science/book/9780120997404</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Problem solving with microbeam analysis
ent://SD_ILS/0/SD_ILS:252223
2024-09-13T21:08:10Z
2024-09-13T21:08:10Z
Author Kiss, Klara.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444989499">http://www.sciencedirect.com/science/book/9780444989499</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Ion beam handbook for material analysis
ent://SD_ILS/0/SD_ILS:256159
2024-09-13T21:08:10Z
2024-09-13T21:08:10Z
Author Mayer, James W., 1930- Rimini, E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124808607">http://www.sciencedirect.com/science/book/9780124808607</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>