Search Results for Semiconductors -- Analysis. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bAnalysis.$0026te$003dILS$0026ps$003d300? 2024-11-14T02:52:15Z Handheld Total Chemical and Biological Analysis Systems Bridging NMR, Digital Microfluidics, and Semiconductors ent://SD_ILS/0/SD_ILS:401929 2024-11-14T02:52:15Z 2024-11-14T02:52:15Z Author&#160;Lei, Ka-Meng. author.&#160;Mak, Pui-In. author.&#160;Law, Man-Kay. author.&#160;Martins, Rui Paulo. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-67825-2">https://doi.org/10.1007/978-3-319-67825-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Trap level spectroscopy in amorphous semiconductors ent://SD_ILS/0/SD_ILS:146716 2024-11-14T02:52:15Z 2024-11-14T02:52:15Z Author&#160;Mikla, Victor I.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123847157">http://www.sciencedirect.com/science/book/9780123847157</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Properties of semiconductor alloys group-IV, III-V and II-VI semiconductors ent://SD_ILS/0/SD_ILS:298337 2024-11-14T02:52:15Z 2024-11-14T02:52:15Z Author&#160;Adachi, Sadao, 1950-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470744383">http://dx.doi.org/10.1002/9780470744383</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=212352&ref=toc">http://www.myilibrary.com?id=212352&ref=toc</a> <a href="http://onlinelibrary.wiley.com/book/10.1002/9780470744383">http://onlinelibrary.wiley.com/book/10.1002/9780470744383</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297966">http://site.ebrary.com/lib/alltitles/Doc?id=10297966</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Properties of group-IV, III-V and II-VI semiconductors ent://SD_ILS/0/SD_ILS:295843 2024-11-14T02:52:15Z 2024-11-14T02:52:15Z Author&#160;Adachi, Sadao, 1950-&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0470090340">http://dx.doi.org/10.1002/0470090340</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/111082133">http://www3.interscience.wiley.com/cgi-bin/bookhome/111082133</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of semiconductor technology ent://SD_ILS/0/SD_ILS:300845 2024-11-14T02:52:15Z 2024-11-14T02:52:15Z Author&#160;Jackson, Kenneth A.&#160;Schr&ouml;ter, W. (Wolfgang)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621828">An electronic book accessible through the World Wide Web; click for information</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621842">An electronic book accessible through the World Wide Web; click for information</a> Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpHSTV0003">http://app.knovel.com/web/toc.v/cid:kpHSTV0003</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527619290">http://dx.doi.org/10.1002/9783527619290</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/43030635.html">http://catalog.hathitrust.org/api/volumes/oclc/43030635.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 ent://SD_ILS/0/SD_ILS:256273 2024-11-14T02:52:15Z 2024-11-14T02:52:15Z Author&#160;Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)&#160;Crean, G. M.&#160;Stuck, R.&#160;Woollam, John A.&#160;European Materials Research Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444899088">http://www.sciencedirect.com/science/book/9780444899088</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>