Search Results for Semiconductors -- Defects -- Congresses.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bDefects$002b--$002bCongresses.$0026te$003dILS$0026ps$003d300?dt=list2024-12-31T17:05:20ZDefects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japanent://SD_ILS/0/SD_ILS:2796162024-12-31T17:05:20Z2024-12-31T17:05:20ZAuthor International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) Yamada-Kaneta, Hiroshi. Sakai, Akira.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995ent://SD_ILS/0/SD_ILS:2562112024-12-31T17:05:20Z2024-12-31T17:05:20ZAuthor International Symposium on Silicon Molecular Beam Epitaxy (6th : 1995 : Strasbourg, France) Kasper, E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444824110">http://www.sciencedirect.com/science/book/9780444824110</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995ent://SD_ILS/0/SD_ILS:2562122024-12-31T17:05:20Z2024-12-31T17:05:20ZAuthor Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444824134">http://www.sciencedirect.com/science/book/9780444824134</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990ent://SD_ILS/0/SD_ILS:2562712024-12-31T17:05:20Z2024-12-31T17:05:20ZAuthor Trieste ICTP-IUPAP Semiconductor Symposium (6th : 1990) Stutzmann, M. (Martin) Chevallier, J. (Jacques)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444891389">http://www.sciencedirect.com/science/book/9780444891389</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2ent://SD_ILS/0/SD_ILS:2562772024-12-31T17:05:20Z2024-12-31T17:05:20ZAuthor International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444884299">http://www.sciencedirect.com/science/book/9780444884299</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>