Search Results for Semiconductors -- Defects.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bDefects.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300?2024-11-05T09:47:22ZLattice defects in semiconductorsent://SD_ILS/0/SD_ILS:581882024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor International Symposium on Lattice Defects in Semiconductors (1966 : Tokyo). Hasiguti, Ryukiti R., ed.<br/>Preferred Shelf Number QC 612.S4 I59 1966<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Gettering Defects in Semiconductorsent://SD_ILS/0/SD_ILS:1820632024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Perevoschikov, Victor A. author. Skoupov, Vladimir D. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-29499-6">http://dx.doi.org/10.1007/3-540-29499-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Light-induced defects in semiconductorsent://SD_ILS/0/SD_ILS:3427512024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Morigaki, Kazuo, author. Hikita, Harumi, author. Ogihara, Chisato, 1951- author.<br/>Preferred Shelf Number ONLINE(342751.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814411493">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Theory of Defects in Semiconductorsent://SD_ILS/0/SD_ILS:1837302024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Drabold, David A. editor. Estreicher, Stefan K. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/11690320">http://dx.doi.org/10.1007/11690320</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japanent://SD_ILS/0/SD_ILS:2796162024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan) Yamada-Kaneta, Hiroshi. Sakai, Akira.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defectsent://SD_ILS/0/SD_ILS:1488202024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Triboulet, R. Siffert, P. (Paul)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080464091">http://www.sciencedirect.com/science/book/9780080464091</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Extended Defects in Semiconductors Electronic Properties, Device Effects and Structuresent://SD_ILS/0/SD_ILS:2376462024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Holt, D. B.. Yacobi, B. G..<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511534850">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>III-nitride semiconductors electrical, structural, and defects propertiesent://SD_ILS/0/SD_ILS:2563572024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Manasreh, Mahmoud Omar.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444506306">http://www.sciencedirect.com/science/book/9780444506306</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of luminescent semiconductor materialsent://SD_ILS/0/SD_ILS:2880072024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Bergman, Leah. McHale, Jeanne L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439834800">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defects and diffusion, theory and simulation an annual retrospective IIent://SD_ILS/0/SD_ILS:2802412024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Fisher, D. J., editor of compilation.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=503469">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=503469</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Trap level spectroscopy in amorphous semiconductorsent://SD_ILS/0/SD_ILS:1467162024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Mikla, Victor I.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123847157">http://www.sciencedirect.com/science/book/9780123847157</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transient-induced latchup in CMOS integrated circuitsent://SD_ILS/0/SD_ILS:2497852024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of semiconductor technologyent://SD_ILS/0/SD_ILS:3008452024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Jackson, Kenneth A. Schröter, W. (Wolfgang)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621828">An electronic book accessible through the World Wide Web; click for information</a>
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HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/43030635.html">http://catalog.hathitrust.org/api/volumes/oclc/43030635.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995ent://SD_ILS/0/SD_ILS:2562112024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor International Symposium on Silicon Molecular Beam Epitaxy (6th : 1995 : Strasbourg, France) Kasper, E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444824110">http://www.sciencedirect.com/science/book/9780444824110</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995ent://SD_ILS/0/SD_ILS:2562122024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France) Borghesi, A. Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444824134">http://www.sciencedirect.com/science/book/9780444824134</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990ent://SD_ILS/0/SD_ILS:2562712024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor Trieste ICTP-IUPAP Semiconductor Symposium (6th : 1990) Stutzmann, M. (Martin) Chevallier, J. (Jacques)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444891389">http://www.sciencedirect.com/science/book/9780444891389</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2ent://SD_ILS/0/SD_ILS:2562772024-11-05T09:47:22Z2024-11-05T09:47:22ZAuthor International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan) Sumino, K. (Kōji), 1931-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444884299">http://www.sciencedirect.com/science/book/9780444884299</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>