Search Results for Semiconductors -- Defects. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bDefects.$0026ps$003d300? 2024-09-17T09:19:56Z Lattice defects in semiconductors ent://SD_ILS/0/SD_ILS:58188 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;International Symposium on Lattice Defects in Semiconductors (1966 : Tokyo).&#160;Hasiguti, Ryukiti R., ed.<br/>Preferred Shelf Number&#160;QC 612.S4 I59 1966<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Gettering Defects in Semiconductors ent://SD_ILS/0/SD_ILS:182063 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Perevoschikov, Victor A. author.&#160;Skoupov, Vladimir D. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-29499-6">http://dx.doi.org/10.1007/3-540-29499-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Light-induced defects in semiconductors ent://SD_ILS/0/SD_ILS:342751 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Morigaki, Kazuo, author.&#160;Hikita, Harumi, author.&#160;Ogihara, Chisato, 1951- author.<br/>Preferred Shelf Number&#160;ONLINE(342751.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9789814411493">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Theory of Defects in Semiconductors ent://SD_ILS/0/SD_ILS:183730 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Drabold, David A. editor.&#160;Estreicher, Stefan K. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/11690320">http://dx.doi.org/10.1007/11690320</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defects-recognition imaging and physics in semiconductors XIV selected peer reviewed papers from the 14th international conference on defects-recognition, imaging and physics in semiconductors, September 25-29, 2011, Miyazaki, Japan ent://SD_ILS/0/SD_ILS:279616 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;International Conference on Defects: Recognition, Imaging and Physics in Semiconductors (2011 : Miyazaki, Japan)&#160;Yamada-Kaneta, Hiroshi.&#160;Sakai, Akira.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=517215</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> CdTe and related compounds physics, defects, technology, hetero- and nanostructures and applications : physics, CdTe-based nanostructures, and semimagnetic semiconductors, defects ent://SD_ILS/0/SD_ILS:148820 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Triboulet, R.&#160;Siffert, P. (Paul)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080464091">http://www.sciencedirect.com/science/book/9780080464091</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Extended Defects in Semiconductors Electronic Properties, Device Effects and Structures ent://SD_ILS/0/SD_ILS:237646 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Holt, D. B..&#160;Yacobi, B. G..<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511534850">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> III-nitride semiconductors electrical, structural, and defects properties ent://SD_ILS/0/SD_ILS:256357 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Manasreh, Mahmoud Omar.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444506306">http://www.sciencedirect.com/science/book/9780444506306</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of luminescent semiconductor materials ent://SD_ILS/0/SD_ILS:288007 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Bergman, Leah.&#160;McHale, Jeanne L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439834800">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defects and diffusion, theory and simulation an annual retrospective II ent://SD_ILS/0/SD_ILS:280241 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Fisher, D. J., editor of compilation.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=503469">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=503469</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Trap level spectroscopy in amorphous semiconductors ent://SD_ILS/0/SD_ILS:146716 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Mikla, Victor I.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123847157">http://www.sciencedirect.com/science/book/9780123847157</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transient-induced latchup in CMOS integrated circuits ent://SD_ILS/0/SD_ILS:249785 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Ker, Ming-Dou.&#160;Hsu, Sheng-Fu.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of semiconductor technology ent://SD_ILS/0/SD_ILS:300845 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Jackson, Kenneth A.&#160;Schr&ouml;ter, W. (Wolfgang)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621828">An electronic book accessible through the World Wide Web; click for information</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621842">An electronic book accessible through the World Wide Web; click for information</a> Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpHSTV0003">http://app.knovel.com/web/toc.v/cid:kpHSTV0003</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527619290">http://dx.doi.org/10.1002/9783527619290</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/43030635.html">http://catalog.hathitrust.org/api/volumes/oclc/43030635.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> C, H, N and O in Si and Characterization and Simulation of Materials and Processes Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995 ent://SD_ILS/0/SD_ILS:256212 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Symposium N on Carbon, Hydrogen, Nitrogen, and Oxygen in Silicon and Other Elemental Semiconductors (1995 : Strasbourg, France)&#160;Borghesi, A.&#160;Symposium G on Atomic Scale Characterization and Simulation of Materials and Processes (1995 : Strasbourg, France)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444824134">http://www.sciencedirect.com/science/book/9780444824134</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Selected Topics in Group IV and II-VI Semiconductors Proceedings of Symposium L and Symposium D of the 1995 E-Mrs Spring Conference, Strasbourg, France, 22-26 May 1995 ent://SD_ILS/0/SD_ILS:256211 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;International Symposium on Silicon Molecular Beam Epitaxy (6th : 1995 : Strasbourg, France)&#160;Kasper, E.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444824110">http://www.sciencedirect.com/science/book/9780444824110</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990 ent://SD_ILS/0/SD_ILS:256271 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;Trieste ICTP-IUPAP Semiconductor Symposium (6th : 1990)&#160;Stutzmann, M. (Martin)&#160;Chevallier, J. (Jacques)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444891389">http://www.sciencedirect.com/science/book/9780444891389</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defect control in semiconductors proceedings of the International Conference on the Science and Technology of Defect Control in Semiconductors, the Yokohama 21st century forum, Yokohama, Japan, September 17-22 1989. Vol. 2 ent://SD_ILS/0/SD_ILS:256277 2024-09-17T09:19:56Z 2024-09-17T09:19:56Z Author&#160;International Conference on the Science and Technology of Defect Control in Semiconductors (1989 : Yokohama-shi, Japan)&#160;Sumino, K. (K&#333;ji), 1931-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444884299">http://www.sciencedirect.com/science/book/9780444884299</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>