Search Results for Semiconductors -- Failures.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bFailures.$0026ic$003dtrue$0026ps$003d300?
2024-10-26T21:46:39Z
Interatomic bonding in solids fundamentals, simulation, applications
ent://SD_ILS/0/SD_ILS:342212
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2024-10-26T21:46:39Z
Author Levitin, Valim.<br/>Preferred Shelf Number ONLINE(342212.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527671557">http://dx.doi.org/10.1002/9783527671557</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Systematische Beurteilung technischer Schadensflle
ent://SD_ILS/0/SD_ILS:342231
2024-10-26T21:46:39Z
2024-10-26T21:46:39Z
Author Pohl, Michael. Lange, Günter.<br/>Preferred Shelf Number ONLINE(342231.1)<br/>Electronic Access ebrary <a href="http://alltitles.ebrary.com/Doc?id=10839246">http://alltitles.ebrary.com/Doc?id=10839246</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527683161">http://dx.doi.org/10.1002/9783527683161</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrical overstress (EOS) : devices, circuits, and systems
ent://SD_ILS/0/SD_ILS:358035
2024-10-26T21:46:39Z
2024-10-26T21:46:39Z
Author Voldman, Steven H.<br/>Preferred Shelf Number TK7871.852 V648 2014<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
2024-10-26T21:46:39Z
2024-10-26T21:46:39Z
Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>