Search Results for Semiconductors -- Failures. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bFailures.$0026te$003dILS$0026ps$003d300?dt=list 2024-11-20T10:29:03Z Interatomic bonding in solids fundamentals, simulation, applications ent://SD_ILS/0/SD_ILS:342212 2024-11-20T10:29:03Z 2024-11-20T10:29:03Z Author&#160;Levitin, Valim.<br/>Preferred Shelf Number&#160;ONLINE(342212.1)<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9783527671557">http://dx.doi.org/10.1002/9783527671557</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Systematische Beurteilung technischer Schadensflle ent://SD_ILS/0/SD_ILS:342231 2024-11-20T10:29:03Z 2024-11-20T10:29:03Z Author&#160;Pohl, Michael.&#160;Lange, G&uuml;nter.<br/>Preferred Shelf Number&#160;ONLINE(342231.1)<br/>Electronic Access&#160;ebrary <a href="http://alltitles.ebrary.com/Doc?id=10839246">http://alltitles.ebrary.com/Doc?id=10839246</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527683161">http://dx.doi.org/10.1002/9783527683161</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrical overstress (EOS) : devices, circuits, and systems ent://SD_ILS/0/SD_ILS:358035 2024-11-20T10:29:03Z 2024-11-20T10:29:03Z Author&#160;Voldman, Steven H.<br/>Preferred Shelf Number&#160;TK7871.852 V648 2014<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> ESD failure mechanisms and models ent://SD_ILS/0/SD_ILS:298375 2024-11-20T10:29:03Z 2024-11-20T10:29:03Z Author&#160;Voldman, Steven H.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>