Search Results for Semiconductors -- Materials -- Testing.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bMaterials$002b--$002bTesting.$0026ps$003d300?dt=list
2026-06-04T17:27:07Z
Nanometer CMOS ICs From Basics to ASICs
ent://SD_ILS/0/SD_ILS:605641
2026-06-04T17:27:07Z
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Author Veendrick, Harry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-64249-4">https://doi.org/10.1007/978-3-031-64249-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanometer CMOS ICs From Basics to ASICs
ent://SD_ILS/0/SD_ILS:613481
2026-06-04T17:27:07Z
2026-06-04T17:27:07Z
Author J.M. Veendrick, Harry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-47597-4">https://doi.org/10.1007/978-3-319-47597-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced calculations for defects in materials : electronic structure methods
ent://SD_ILS/0/SD_ILS:269597
2026-06-04T17:27:07Z
2026-06-04T17:27:07Z
Author Alkauskas, Audrius.<br/>Preferred Shelf Number TA410 A379 2011<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
Microelectronics
ent://SD_ILS/0/SD_ILS:547489
2026-06-04T17:27:07Z
2026-06-04T17:27:07Z
Author Whitaker, Jerry C.<br/>Preferred Shelf Number TK7874 .M4587 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>