Search Results for Semiconductors -- Optical properties -- Congresses.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bOptical$002bproperties$002b--$002bCongresses.$0026ps$003d300?2025-03-15T22:42:03ZOptical properties of semiconductor nanostructuresent://SD_ILS/0/SD_ILS:1123582025-03-15T22:42:03Z2025-03-15T22:42:03ZAuthor Sadowski, Marcin L. Potemski, Marek. Grynberg, Marian.<br/>Preferred Shelf Number QC611.6.O6 O6613 2000<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992ent://SD_ILS/0/SD_ILS:2562732025-03-15T22:42:03Z2025-03-15T22:42:03ZAuthor Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444899088">http://www.sciencedirect.com/science/book/9780444899088</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>