Search Results for Semiconductors -- Reliability.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors$002b--$002bReliability.$0026te$003dILS$0026ps$003d300?
2024-11-08T05:34:44Z
Strain-engineered MOSFETs
ent://SD_ILS/0/SD_ILS:288147
2024-11-08T05:34:44Z
2024-11-08T05:34:44Z
Author Maiti, C. K. Maiti, T. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466503472">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2024-11-08T05:34:44Z
2024-11-08T05:34:44Z
Author Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
2024-11-08T05:34:44Z
2024-11-08T05:34:44Z
Author Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transient-induced latchup in CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:249785
2024-11-08T05:34:44Z
2024-11-08T05:34:44Z
Author Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>