Search Results for Semiconductors -- Testing.
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2026-06-05T22:57:42Z
Nanometer CMOS ICs From Basics to ASICs
ent://SD_ILS/0/SD_ILS:605641
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Author Veendrick, Harry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-64249-4">https://doi.org/10.1007/978-3-031-64249-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Practical ESD protection design
ent://SD_ILS/0/SD_ILS:597233
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Author Wang, Albert Z. H., 1962- author.<br/>Preferred Shelf Number TK7874<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119850434</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electronics, power electronics, optoelectronics, microwaves, electromagnetics, and radar
ent://SD_ILS/0/SD_ILS:547507
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Author Dorf, Richard C., author Dorf, Richard C., editor.<br/>Preferred Shelf Number TK145<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315222158">https://www.taylorfrancis.com/books/9781315222158</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanometer CMOS ICs From Basics to ASICs
ent://SD_ILS/0/SD_ILS:613481
2026-06-05T22:57:42Z
2026-06-05T22:57:42Z
Author J.M. Veendrick, Harry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-47597-4">https://doi.org/10.1007/978-3-319-47597-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computational Advancement in Communication Circuits and Systems Proceedings of ICCACCS 2014
ent://SD_ILS/0/SD_ILS:530561
2026-06-05T22:57:42Z
2026-06-05T22:57:42Z
Author Maharatna, Koushik. editor. Dalapati, Goutam Kumar. editor. Banerjee, P K. editor. Mallick, Amiya Kumar. editor. Mukherjee, Moumita. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-81-322-2274-3">https://doi.org/10.1007/978-81-322-2274-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Testing for small-delay defects in nanoscale CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:547467
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Author Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Preferred Shelf Number TK7871.99 .M44 T43 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315217819">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Advanced calculations for defects in materials : electronic structure methods
ent://SD_ILS/0/SD_ILS:269597
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Author Alkauskas, Audrius.<br/>Preferred Shelf Number TA410 A379 2011<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
RF and microwave modeling and measurement techniques for field effect transistors
ent://SD_ILS/0/SD_ILS:280925
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2026-06-05T22:57:42Z
Author Gao, Jianjun, 1968- Knovel (Firm)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Microelectronics
ent://SD_ILS/0/SD_ILS:547489
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Author Whitaker, Jerry C.<br/>Preferred Shelf Number TK7874 .M4587 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420037593">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Semiconductor material and device characterization
ent://SD_ILS/0/SD_ILS:249492
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Author Schroder, Dieter K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
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2026-06-05T22:57:42Z
Author Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527615117">http://dx.doi.org/10.1002/9783527615117</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Principles of semiconductor network testing
ent://SD_ILS/0/SD_ILS:254328
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Author Afshar, Amir.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750694728">http://www.sciencedirect.com/science/book/9780750694728</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
ent://SD_ILS/0/SD_ILS:256193
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Author Perkowitz, S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125507707">http://www.sciencedirect.com/science/book/9780125507707</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>