Search Results for Semiconductors -- Testing.
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Testing for small-delay defects in nanoscale CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:342881
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Author Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.<br/>Preferred Shelf Number ONLINE(342881.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced calculations for defects in materials : electronic structure methods
ent://SD_ILS/0/SD_ILS:269597
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Author Alkauskas, Audrius.<br/>Preferred Shelf Number TA410 A379 2011<br/>Format: Books<br/>Availability Beytepe Library~1<br/>
RF and microwave modeling and measurement techniques for field effect transistors
ent://SD_ILS/0/SD_ILS:280925
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Author Gao, Jianjun, 1968- Knovel (Firm)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor material and device characterization
ent://SD_ILS/0/SD_ILS:249492
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Author Schroder, Dieter K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
ent://SD_ILS/0/SD_ILS:300738
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Author Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527615117">http://dx.doi.org/10.1002/9783527615117</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Principles of semiconductor network testing
ent://SD_ILS/0/SD_ILS:254328
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Author Afshar, Amir.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750694728">http://www.sciencedirect.com/science/book/9780750694728</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
ent://SD_ILS/0/SD_ILS:256193
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Author Perkowitz, S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125507707">http://www.sciencedirect.com/science/book/9780125507707</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>