Search Results for Semiconductors. - Narrowed by: 2009 - Electronic books.
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Properties of semiconductor alloys group-IV, III-V and II-VI semiconductors
ent://SD_ILS/0/SD_ILS:298337
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Author Adachi, Sadao, 1950-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470744383">http://dx.doi.org/10.1002/9780470744383</a>
MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=212352&ref=toc">http://www.myilibrary.com?id=212352&ref=toc</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470744383">http://onlinelibrary.wiley.com/book/10.1002/9780470744383</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10297966">http://site.ebrary.com/lib/alltitles/Doc?id=10297966</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Processing of nanoparticle structures and composites a collection of papers presented at the 2008 Materials Science and Technology Conference (MS & T08) October 5-9, 2008, Pittsburgh, Pennsylvania
ent://SD_ILS/0/SD_ILS:297847
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Author Materials Science & Technology Conference (2008 : Pittsburgh, Pa.) Hinklin, Tom. Lu, Kathy. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470551523">http://dx.doi.org/10.1002/9780470551523</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10341612">http://site.ebrary.com/lib/alltitles/Doc?id=10341612</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
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Author Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transient-induced latchup in CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:249785
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Author Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes
ent://SD_ILS/0/SD_ILS:297388
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Author Wong, Ban P., 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074">Click here to view book</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2">http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470382820">http://dx.doi.org/10.1002/9780470382820</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074_0">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074_0</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10278707">http://site.ebrary.com/lib/alltitles/Doc?id=10278707</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power electronics semiconductor devices
ent://SD_ILS/0/SD_ILS:297969
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Author Perret, Robert (Robert Jos)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477696">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477696</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611494">http://dx.doi.org/10.1002/9780470611494</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=31186">http://www.books24x7.com/marc.asp?bookid=31186</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10361049">http://site.ebrary.com/lib/alltitles/Doc?id=10361049</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
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Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrical characterization of organic electronic materials and devices
ent://SD_ILS/0/SD_ILS:298419
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Author Stallinga, Peter, 1966- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470750162">http://dx.doi.org/10.1002/9780470750162</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10342813">http://site.ebrary.com/lib/alltitles/Doc?id=10342813</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Organic electronics structural and electronic properties of OFETs
ent://SD_ILS/0/SD_ILS:304906
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Author Wöll, Christof. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482374">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482374</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527627387">http://dx.doi.org/10.1002/9783527627387</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/122498289">http://www3.interscience.wiley.com/cgi-bin/bookhome/122498289</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10313609">http://site.ebrary.com/lib/alltitles/Doc?id=10313609</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>