Search Results for Semiconductors. - Narrowed by: Electronic circuits. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors.$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300?dt=list 2024-08-11T00:25:45Z Light-Emitting Diodes Materials, Processes, Devices and Applications ent://SD_ILS/0/SD_ILS:482843 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Li, Jinmin. editor.&#160;Zhang, G. Q. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-99211-2">https://doi.org/10.1007/978-3-319-99211-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bias Temperature Instability for Devices and Circuits ent://SD_ILS/0/SD_ILS:484755 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Grasser, Tibor. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-7909-3">https://doi.org/10.1007/978-1-4614-7909-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications ent://SD_ILS/0/SD_ILS:489246 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Franco, Jacopo. author.&#160;Kaczer, Ben. author.&#160;Groeseneken, Guido. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-94-007-7663-0">https://doi.org/10.1007/978-94-007-7663-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Exploring Memory Hierarchy Design with Emerging Memory Technologies ent://SD_ILS/0/SD_ILS:487749 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Sun, Guangyu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-00681-9">https://doi.org/10.1007/978-3-319-00681-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Trace-Based Post-Silicon Validation for VLSI Circuits ent://SD_ILS/0/SD_ILS:488098 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Liu, Xiao. author.&#160;Xu, Qiang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-00533-1">https://doi.org/10.1007/978-3-319-00533-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Energy-Efficient Fault-Tolerant Systems ent://SD_ILS/0/SD_ILS:487301 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Mathew, Jimson. editor.&#160;Shafik, Rishad A. editor.&#160;Pradhan, Dhiraj K. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-4193-9">https://doi.org/10.1007/978-1-4614-4193-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs ent://SD_ILS/0/SD_ILS:487405 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Noia, Brandon. author.&#160;Chakrabarty, Krishnendu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> MOSFET Technologies for Double-Pole Four-Throw Radio-Frequency Switch ent://SD_ILS/0/SD_ILS:488363 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Srivastava, Viranjay M. author.&#160;Singh, Ghanshyam. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-01165-3">https://doi.org/10.1007/978-3-319-01165-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Flash Memories Economic Principles of Performance, Cost and Reliability Optimization ent://SD_ILS/0/SD_ILS:488848 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Richter, Detlev. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-94-007-6082-0">https://doi.org/10.1007/978-94-007-6082-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor Technologies in the Era of Electronics ent://SD_ILS/0/SD_ILS:489171 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Kang, Yong Hoon. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-94-017-8768-0">https://doi.org/10.1007/978-94-017-8768-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic devices and circuits ent://SD_ILS/0/SD_ILS:363141 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Bell, David A.<br/>Preferred Shelf Number&#160;TK7871.85 B3785 2010<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Electronic devices and circuits ent://SD_ILS/0/SD_ILS:385933 2024-08-11T00:25:45Z 2024-08-11T00:25:45Z Author&#160;Nagrath, I. J.<br/>Preferred Shelf Number&#160;TK7860 N34 2007<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/>