Search Results for Semiconductors. - Narrowed by: Integrated circuits -- Reliability.
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2024-08-11T11:25:41Z
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2024-08-11T11:25:41Z
2024-08-11T11:25:41Z
Author Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
ESD failure mechanisms and models
ent://SD_ILS/0/SD_ILS:298375
2024-08-11T11:25:41Z
2024-08-11T11:25:41Z
Author Voldman, Steven H. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470747254">http://dx.doi.org/10.1002/9780470747254</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10317806">http://site.ebrary.com/lib/alltitles/Doc?id=10317806</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>