Search Results for Semiconductors. - Narrowed by: Semiconductors -- Defects. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors.$0026qf$003dSUBJECT$002509Subject$002509Semiconductors$002b--$002bDefects.$002509Semiconductors$002b--$002bDefects.$0026ps$003d300?dt=list 2024-08-10T21:04:06Z Light-induced defects in semiconductors ent://SD_ILS/0/SD_ILS:342751 2024-08-10T21:04:06Z 2024-08-10T21:04:06Z Author&#160;Morigaki, Kazuo, author.&#160;Hikita, Harumi, author.&#160;Ogihara, Chisato, 1951- author.<br/>Preferred Shelf Number&#160;ONLINE(342751.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9789814411493">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Extended Defects in Semiconductors Electronic Properties, Device Effects and Structures ent://SD_ILS/0/SD_ILS:237646 2024-08-10T21:04:06Z 2024-08-10T21:04:06Z Author&#160;Holt, D. B..&#160;Yacobi, B. G..<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511534850">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defects and diffusion, theory and simulation an annual retrospective II ent://SD_ILS/0/SD_ILS:280241 2024-08-10T21:04:06Z 2024-08-10T21:04:06Z Author&#160;Fisher, D. J., editor of compilation.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=503469">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=503469</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of semiconductor technology ent://SD_ILS/0/SD_ILS:300845 2024-08-10T21:04:06Z 2024-08-10T21:04:06Z Author&#160;Jackson, Kenneth A.&#160;Schr&ouml;ter, W. (Wolfgang)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621828">An electronic book accessible through the World Wide Web; click for information</a> Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527621842">An electronic book accessible through the World Wide Web; click for information</a> Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpHSTV0003">http://app.knovel.com/web/toc.v/cid:kpHSTV0003</a> John Wiley <a href="http://dx.doi.org/10.1002/9783527619290">http://dx.doi.org/10.1002/9783527619290</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/43030635.html">http://catalog.hathitrust.org/api/volumes/oclc/43030635.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>