Search Results for Semiconductors. - Narrowed by: Semiconductors -- Optical properties -- Congresses.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSemiconductors.$0026qf$003dSUBJECT$002509Subject$002509Semiconductors$002b--$002bOptical$002bproperties$002b--$002bCongresses.$002509Semiconductors$002b--$002bOptical$002bproperties$002b--$002bCongresses.$0026ps$003d300?dt=list2024-08-11T05:32:42ZOptical properties of semiconductor nanostructuresent://SD_ILS/0/SD_ILS:1123582024-08-11T05:32:42Z2024-08-11T05:32:42ZAuthor Sadowski, Marcin L. Potemski, Marek. Grynberg, Marian.<br/>Preferred Shelf Number QC611.6.O6 O6613 2000<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992ent://SD_ILS/0/SD_ILS:2562732024-08-11T05:32:42Z2024-08-11T05:32:42ZAuthor Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444899088">http://www.sciencedirect.com/science/book/9780444899088</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>