Search Results for Semiconductors. - Narrowed by: Semiconductors -- Testing.
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2024-08-11T15:30:35Z
Semiconductor material and device characterization
ent://SD_ILS/0/SD_ILS:249492
2024-08-11T15:30:35Z
2024-08-11T15:30:35Z
Author Schroder, Dieter K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
ent://SD_ILS/0/SD_ILS:300738
2024-08-11T15:30:35Z
2024-08-11T15:30:35Z
Author Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527615117">http://dx.doi.org/10.1002/9783527615117</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Principles of semiconductor network testing
ent://SD_ILS/0/SD_ILS:254328
2024-08-11T15:30:35Z
2024-08-11T15:30:35Z
Author Afshar, Amir.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750694728">http://www.sciencedirect.com/science/book/9780750694728</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>