Search Results for Silicon. - Narrowed by: Integrated circuits -- Very large scale integration -- Design.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSilicon.$0026qf$003dSUBJECT$002509Subject$002509Integrated$002bcircuits$002b--$002bVery$002blarge$002bscale$002bintegration$002b--$002bDesign.$002509Integrated$002bcircuits$002b--$002bVery$002blarge$002bscale$002bintegration$002b--$002bDesign.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-09-23T17:57:42ZSystem-on-chip test architectures nanometer design for testabilityent://SD_ILS/0/SD_ILS:1485572024-09-23T17:57:42Z2024-09-23T17:57:42ZAuthor Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123739735">http://www.sciencedirect.com/science/book/9780123739735</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI test principles and architectures design for testabilityent://SD_ILS/0/SD_ILS:2537792024-09-23T17:57:42Z2024-09-23T17:57:42ZAuthor Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>