Search Results for Software engineering. - Narrowed by: Electronic books. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSoftware$002bengineering.$0026qf$003dSUBJECT$002509Konu$002509Electronic$002bbooks.$002509Electronic$002bbooks.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-25T13:05:07Z Trustworthy systems through quantitative software engineering ent://SD_ILS/0/SD_ILS:249437 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Bernstein, Lawrence, 1940-&#160;Yuhas, C. M.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988898</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Systems and software engineering with applications ent://SD_ILS/0/SD_ILS:249813 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Schneidewind, Norman.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5769539</a> IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539">http://ieeexplore.ieee.org/servlet/opac?bknumber=5769539</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The road map to software engineering a standards-based guide ent://SD_ILS/0/SD_ILS:249844 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Moore, James W., 1948-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5989673">http://ieeexplore.ieee.org/servlet/opac?bknumber=5989673</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical support for ISO 9001 software project documentation using IEEE software engineering standards ent://SD_ILS/0/SD_ILS:249846 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Land, Susan K.&#160;Walz, John W.&#160;IEEE Computer Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5989411">http://ieeexplore.ieee.org/servlet/opac?bknumber=5989411</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Simple statistical methods for software engineering : data and patterns ent://SD_ILS/0/SD_ILS:380133 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Pandian, C. Ravindranath, author.&#160;Kumar S. K., Murali, author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439816622">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computer, network, software, and hardware engineering with applications ent://SD_ILS/0/SD_ILS:249355 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Schneidewind, Norman.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEEXplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168884">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168884</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Case study research in software engineering guidelines and examples ent://SD_ILS/0/SD_ILS:299115 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Runeson, Per, 1966-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818522">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818522</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118181034">http://dx.doi.org/10.1002/9781118181034</a> <a href="http://swb.eblib.com/patron/FullRecord.aspx?p=818522">http://swb.eblib.com/patron/FullRecord.aspx?p=818522</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The dark side of software engineering the ethics and realities of subversion, lying, espionage, and other nefarious activities ent://SD_ILS/0/SD_ILS:249321 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Rost, Johann.&#160;Glass, Robert L., 1932-&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381796">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381796</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical support for lean six sigma software process definition using IEEE software engineering standards ent://SD_ILS/0/SD_ILS:249325 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Land, Susan K.&#160;Smith, Douglas Burr, 1943-&#160;Walz, John W.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129687">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129687</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> IEEE Computer Society real-world software engineering problems a self-study guide for today's software professional ent://SD_ILS/0/SD_ILS:249830 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Naveda, J. Fernando.&#160;Seidman, Stephen B.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5989366">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5989366</a> IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5989366">http://ieeexplore.ieee.org/servlet/opac?bknumber=5989366</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Jumpstart CMM/CMMI software process improvements Using IEEE software engineering standards ent://SD_ILS/0/SD_ILS:249843 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Land, Susan K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5989567">http://ieeexplore.ieee.org/servlet/opac?bknumber=5989567</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Enterprise software architecture and design entities, services, and resources ent://SD_ILS/0/SD_ILS:299111 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Duggan, Dominic.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118180518">http://dx.doi.org/10.1002/9781118180518</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10529323">http://site.ebrary.com/lib/alltitles/Doc?id=10529323</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software performance and scalability a quantitative approach ent://SD_ILS/0/SD_ILS:297728 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Liu, Henry H.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=33731">http://www.books24x7.com/marc.asp?bookid=33731</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=448916">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=448916</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470465394">http://dx.doi.org/10.1002/9780470465394</a> Safari Books Online <a href="http://proquest.safaribooksonline.com/?fpi=9780470462539">http://proquest.safaribooksonline.com/?fpi=9780470462539</a> MyiLibrary, Table of contents <a href="http://www.myilibrary.com?id=223744&ref=toc">http://www.myilibrary.com?id=223744&ref=toc</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Trustworthy compilers ent://SD_ILS/0/SD_ILS:297923 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Safonov, V. O. (Vladimir Olegovich)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=35179">http://www.books24x7.com/marc.asp?bookid=35179</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=485634">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=485634</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470593387">http://dx.doi.org/10.1002/9780470593387</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10366446">http://site.ebrary.com/lib/alltitles/Doc?id=10366446</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software measurement and estimation a practical approach ent://SD_ILS/0/SD_ILS:249472 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Laird, Linda M., 1952-&#160;Brennan, M. Carol, 1954-&#160;IEEE Computer Society.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Unit testing in Java how tests drive the code ent://SD_ILS/0/SD_ILS:253658 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Link, Johannes.&#160;Frlich, Peter.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www.sciencedirect.com/science/book/9781558608689">http://www.sciencedirect.com/science/book/9781558608689</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software architecture. 1 ent://SD_ILS/0/SD_ILS:342044 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Oussalah, Mourad, editor of compilation.<br/>Preferred Shelf Number&#160;ONLINE(342044.1)<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9781118930960">http://dx.doi.org/10.1002/9781118930960</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=63727">http://www.books24x7.com/marc.asp?bookid=63727</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Rapid prototyping of software for avionics systems : model-oriented approaches for complex systems certification ent://SD_ILS/0/SD_ILS:342171 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Larrieu, Nicolas, author.&#160;Varet, Antoine, author.<br/>Preferred Shelf Number&#160;ONLINE(342171.1)<br/>Electronic Access&#160;ebrary <a href="http://alltitles.ebrary.com/Doc?id=10954089">An electronic book accessible through the World Wide Web; click to view</a> John Wiley <a href="http://dx.doi.org/10.1002/9781119050643">http://dx.doi.org/10.1002/9781119050643</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Beyond redundancy how geographic redundancy can improve service availability and reliability of computer-based systems ent://SD_ILS/0/SD_ILS:249351 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Bauer, Eric.&#160;Adams, Randee.&#160;Eustace, Dan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598">http://ieeexplore.ieee.org/servlet/opac?bknumber=6047598</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solving enterprise applications performance puzzles queuing models to the rescue ent://SD_ILS/0/SD_ILS:249357 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Grinshpan, L. A. (Leonid Abramovich)&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEEXplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168885">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168885</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semantic web and model-driven engineering ent://SD_ILS/0/SD_ILS:249367 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Parreiras, Fernando Silva.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=6218883">http://ieeexplore.ieee.org/servlet/opac?bknumber=6218883</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Practical database programming with Java ent://SD_ILS/0/SD_ILS:249918 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Bai, Ying, 1956-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988888">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988888</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Making sense of agile project management balancing control and agility ent://SD_ILS/0/SD_ILS:298936 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Cobb, Charles G., 1945-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118085950">An electronic book accessible through the World Wide Web; click for information</a> Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=40741">http://www.books24x7.com/marc.asp?bookid=40741</a> Wiley InterScience - Full Text Online <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118085950">http://onlinelibrary.wiley.com/book/10.1002/9781118085950</a> Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9780470943366.jpg">http://catalogimages.wiley.com/images/db/jimages/9780470943366.jpg</a> <a href="http://site.ebrary.com/lib/alltitles/Doc?id=10447802">http://site.ebrary.com/lib/alltitles/Doc?id=10447802</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software metrics and software metrology ent://SD_ILS/0/SD_ILS:249319 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Abran, Alain, 1949-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Managing and leading software projects ent://SD_ILS/0/SD_ILS:249314 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Fairley, R. E. (Richard E.), 1937-&#160;IEEE Computer Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381789">An electronic book accessible through the World Wide Web; click for information</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software maintenance management evaluation and continuous improvement ent://SD_ILS/0/SD_ILS:249324 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;April, Alain, 1958-&#160;Abran, Alain, 1949-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129685">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129685</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of applied algorithms solving scientific, engineering and practical problems ent://SD_ILS/0/SD_ILS:249540 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Nayak, Amiya.&#160;Stojmenovi&#263;, Ivan.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201533">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201533</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dependability benchmarking for computer systems ent://SD_ILS/0/SD_ILS:249772 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Kanoun, Karama.&#160;Spainhower, Lisa.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6129686</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software testing testing across the entire software development life cycle ent://SD_ILS/0/SD_ILS:249509 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Everett, Gerald D., 1943-&#160;McLeod, Raymond.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201507</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The cognitive dynamics of computer science cost-effective large scale software development ent://SD_ILS/0/SD_ILS:249473 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;De Gyurky, Szabolcs Michael.&#160;Tarbell, Mark A.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5201429">http://ieeexplore.ieee.org/servlet/opac?bknumber=5201429</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Digital signal processing a computer science perspective ent://SD_ILS/0/SD_ILS:318790 2024-12-25T13:05:07Z 2024-12-25T13:05:07Z Author&#160;Stein, Jonathan Y.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE(318790.1)<br/>Electronic Access&#160;<a href="http://proquest.safaribooksonline.com/?fpi=9780471295464">Available by subscription from Safari Books Online</a> John Wiley <a href="http://dx.doi.org/10.1002/047120059X">http://dx.doi.org/10.1002/047120059X</a> MyiLibrary <a href="http://www.myilibrary.com?id=55617">http://www.myilibrary.com?id=55617</a> Table of contents <a href="http://catdir.loc.gov/catdir/toc/onix05/00035905.html">http://catdir.loc.gov/catdir/toc/onix05/00035905.html</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley045/00035905.html">http://catdir.loc.gov/catdir/bios/wiley045/00035905.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>