Search Results for Solutions. - Narrowed by: Systems engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSolutions.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300? 2024-11-08T11:08:03Z SAT-Based Scalable Formal Verification Solutions ent://SD_ILS/0/SD_ILS:166702 2024-11-08T11:08:03Z 2024-11-08T11:08:03Z Author&#160;Ganai, Malay K. author.&#160;Gupta, Aarti. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-69167-1">http://dx.doi.org/10.1007/978-0-387-69167-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integrated Frequency Synthesis for Convergent Wireless Solutions ent://SD_ILS/0/SD_ILS:173947 2024-11-08T11:08:03Z 2024-11-08T11:08:03Z Author&#160;Atallah, Jad G. author.&#160;Ismail, Mohammed. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1466-7">http://dx.doi.org/10.1007/978-1-4614-1466-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies ent://SD_ILS/0/SD_ILS:172103 2024-11-08T11:08:03Z 2024-11-08T11:08:03Z Author&#160;Bosio, Alberto. author.&#160;Dilillo, Luigi. author.&#160;Girard, Patrick. author.&#160;Pravossoudovitch, Serge. author.&#160;Virazel, Arnaud. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-0938-1">http://dx.doi.org/10.1007/978-1-4419-0938-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>