Search Results for Spectroscopy and Microscopy. - Narrowed by: Nanotechnology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSpectroscopy$002band$002bMicroscopy.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026te$003dILS$0026ps$003d300?dt=list2025-03-18T19:09:28ZNanoparticles Workhorses of Nanoscienceent://SD_ILS/0/SD_ILS:5307512025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor de Mello Donegá, Celso. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-44823-6">https://doi.org/10.1007/978-3-662-44823-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Physics of Grapheneent://SD_ILS/0/SD_ILS:5307182025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor Aoki, Hideo. editor. S. Dresselhaus, Mildred. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-02633-6">https://doi.org/10.1007/978-3-319-02633-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Helium Ion Microscopy Principles and Applicationsent://SD_ILS/0/SD_ILS:3324382025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor Joy, David C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332438.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8660-2">http://dx.doi.org/10.1007/978-1-4614-8660-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Local Electrode Atom Probe Tomography A User's Guideent://SD_ILS/0/SD_ILS:3324442025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.<br/>Preferred Shelf Number ONLINE(332444.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8721-0">http://dx.doi.org/10.1007/978-1-4614-8721-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>UV-VIS and Photoluminescence Spectroscopy for Nanomaterials Characterizationent://SD_ILS/0/SD_ILS:3331572025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor Kumar, Challa. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333157.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27594-4">http://dx.doi.org/10.1007/978-3-642-27594-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Theory of Bilayer Graphene Spectroscopyent://SD_ILS/0/SD_ILS:3333742025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor Mucha-Kruczyński, Marcin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333374.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-30936-6">http://dx.doi.org/10.1007/978-3-642-30936-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Photoemission Spectroscopy on High Temperature Superconductor A Study of Bi2Sr2CaCu2O8 by Laser-Based Angle-Resolved Photoemissionent://SD_ILS/0/SD_ILS:3335792025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor Zhang, Wentao. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333579.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-32472-7">http://dx.doi.org/10.1007/978-3-642-32472-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraineent://SD_ILS/0/SD_ILS:3323212025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332321.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7675-7">http://dx.doi.org/10.1007/978-1-4614-7675-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonanceent://SD_ILS/0/SD_ILS:3327762025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor van Schooten, Kipp. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332776.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nanoscopy and multidimensional optical fluorescence microscopyent://SD_ILS/0/SD_ILS:2887792025-03-18T19:09:28Z2025-03-18T19:09:28ZAuthor Diaspro, Alberto, 1959-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420078893">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>