Search Results for Spectroscopy and Microscopy. - Narrowed by: Semiconductors. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSpectroscopy$002band$002bMicroscopy.$0026qf$003dSUBJECT$002509Subject$002509Semiconductors.$002509Semiconductors.$0026te$003dILS$0026ps$003d300? 2025-12-15T04:56:06Z Physics of Graphene ent://SD_ILS/0/SD_ILS:530718 2025-12-15T04:56:06Z 2025-12-15T04:56:06Z Author&#160;Aoki, Hideo. editor.&#160;S. Dresselhaus, Mildred. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-02633-6">https://doi.org/10.1007/978-3-319-02633-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Resonance Effects of Excitons and Electrons Basics and Applications ent://SD_ILS/0/SD_ILS:334053 2025-12-15T04:56:06Z 2025-12-15T04:56:06Z Author&#160;Geru, Ion. author.&#160;Suter, Dieter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334053.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-35807-4">http://dx.doi.org/10.1007/978-3-642-35807-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance ent://SD_ILS/0/SD_ILS:332776 2025-12-15T04:56:06Z 2025-12-15T04:56:06Z Author&#160;van Schooten, Kipp. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332776.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>