Search Results for Spectroscopy. - Narrowed by: E-Book - X-ray spectroscopy.
SirsiDynix Enterprise
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Handbook of X-ray spectrometry
ent://SD_ILS/0/SD_ILS:284651
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Author Grieken, R. van (Ren)̌ Markowicz, Andrzej.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203908709">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications of synchrotron radiation to materials analysis
ent://SD_ILS/0/SD_ILS:252660
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Author Saisho, H. (Hideo) Gohshi, Y. (Yohichi)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444888570">http://www.sciencedirect.com/science/book/9780444888570</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
X-rays and materials
ent://SD_ILS/0/SD_ILS:305406
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Author Goudeau, Philippe. Guinebretière, René.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=425390">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118562888">http://dx.doi.org/10.1002/9781118562888</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Thin film analysis by X-ray scattering
ent://SD_ILS/0/SD_ILS:302207
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Author Birkholz, Mario. Fewster, Paul F. Genzel, Christoph. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/3527607595">http://dx.doi.org/10.1002/3527607595</a>
<a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282">http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Structure and dynamics of macromolecules absorption and fluorescence studies
ent://SD_ILS/0/SD_ILS:252617
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Author Albani, J. R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444514493">http://www.sciencedirect.com/science/book/9780444514493</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
X-Ray Spectrometry: Recent Technological Advances
ent://SD_ILS/0/SD_ILS:295746
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Author Tsuji, Kouichi. John Wiley & Sons, Inc.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470020431">http://dx.doi.org/10.1002/0470020431</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470020432">http://dx.doi.org/10.1002/9780470020432</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
X-ray fluorescence spectrometry
ent://SD_ILS/0/SD_ILS:300375
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Author Jenkins, Ron, 1932-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781118521014">http://dx.doi.org/10.1002/9781118521014</a>
ebrary <a href="http://site.ebrary.com/id/10596943">http://site.ebrary.com/id/10596943</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
X-ray characterization of materials
ent://SD_ILS/0/SD_ILS:300697
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Author Lifshin, Eric. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527613748">http://dx.doi.org/10.1002/9783527613748</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>