Search Results for Spectroscopy. - Narrowed by: English - Materials Science. - Spectroscopy and Microscopy. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSpectroscopy.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dSUBJECT$002509Subject$002509Materials$002bScience.$002509Materials$002bScience.$0026qf$003dSUBJECT$002509Subject$002509Spectroscopy$002band$002bMicroscopy.$002509Spectroscopy$002band$002bMicroscopy.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-09-11T19:16:07Z Helium Ion Microscopy Principles and Applications ent://SD_ILS/0/SD_ILS:332438 2024-09-11T19:16:07Z 2024-09-11T19:16:07Z Author&#160;Joy, David C. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332438.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-8660-2">http://dx.doi.org/10.1007/978-1-4614-8660-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Local Electrode Atom Probe Tomography A User's Guide ent://SD_ILS/0/SD_ILS:332444 2024-09-11T19:16:07Z 2024-09-11T19:16:07Z Author&#160;Larson, David J. author.&#160;Prosa, Ty J. author.&#160;Ulfig, Robert M. author.&#160;Geiser, Brian P. author.&#160;Kelly, Thomas F. author.<br/>Preferred Shelf Number&#160;ONLINE(332444.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-8721-0">http://dx.doi.org/10.1007/978-1-4614-8721-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>