Search Results for Spectroscopy. - Narrowed by: Online Library - Characterization and Evaluation of Materials. - Nanotechnology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSpectroscopy.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Characterization$002band$002bEvaluation$002bof$002bMaterials.$002509Characterization$002band$002bEvaluation$002bof$002bMaterials.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?2024-09-10T13:12:24ZHelium Ion Microscopy Principles and Applicationsent://SD_ILS/0/SD_ILS:3324382024-09-10T13:12:24Z2024-09-10T13:12:24ZAuthor Joy, David C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332438.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8660-2">http://dx.doi.org/10.1007/978-1-4614-8660-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Local Electrode Atom Probe Tomography A User's Guideent://SD_ILS/0/SD_ILS:3324442024-09-10T13:12:24Z2024-09-10T13:12:24ZAuthor Larson, David J. author. Prosa, Ty J. author. Ulfig, Robert M. author. Geiser, Brian P. author. Kelly, Thomas F. author.<br/>Preferred Shelf Number ONLINE(332444.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-8721-0">http://dx.doi.org/10.1007/978-1-4614-8721-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>