Search Results for Spectroscopy. - Narrowed by: Online Library - Surfaces (Technology) -- Analysis.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSpectroscopy.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Technology$002529$002b--$002bAnalysis.$002509Surfaces$002b$002528Technology$002529$002b--$002bAnalysis.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list2024-08-11T04:38:54ZHandbook of surface and interface analysis methods for problem-solvingent://SD_ILS/0/SD_ILS:2847332024-08-11T04:38:54Z2024-08-11T04:38:54ZAuthor Rivir̈e, J. C. Myhra, S. (Sverre), 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420007800">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>An introduction to surface analysis by XPS and AESent://SD_ILS/0/SD_ILS:3011562024-08-11T04:38:54Z2024-08-11T04:38:54ZAuthor Watts, John F. Wolstenholme, John. John Wiley & Sons. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470867930">http://dx.doi.org/10.1002/0470867930</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>X-ray characterization of materialsent://SD_ILS/0/SD_ILS:3006972024-08-11T04:38:54Z2024-08-11T04:38:54ZAuthor Lifshin, Eric. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527613748">http://dx.doi.org/10.1002/9783527613748</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>