Search Results for Spectroscopy. - Narrowed by: Thin films. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSpectroscopy.$0026qf$003dSUBJECT$002509Subject$002509Thin$002bfilms.$002509Thin$002bfilms.$0026pe$003dd$00253A$0026ps$003d300? 2025-03-16T05:37:41Z Correlation spectroscopy of surfaces, thin films, and nanostructures ent://SD_ILS/0/SD_ILS:302072 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Berakdar, J., 1964-&#160;Kirschner, J. (J&uuml;rgen), 1945-&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Volltext <a href="http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=3527603425">http://www3.interscience.wiley.com/cgi-bin/homepage/?isbn=3527603425</a> John Wiley <a href="http://dx.doi.org/10.1002/3527603425">http://dx.doi.org/10.1002/3527603425</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoscale Materials for Warfare Agent Detection: Nanoscience for Security ent://SD_ILS/0/SD_ILS:482894 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Bittencourt, Carla. editor.&#160;Ewels, Chris. editor.&#160;Llobet, Eduard. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-94-024-1620-6">https://doi.org/10.1007/978-94-024-1620-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoscience Advances in CBRN Agents Detection, Information and Energy Security ent://SD_ILS/0/SD_ILS:530213 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Petkov, Plamen. editor.&#160;Tsiulyanu, Dumitru. editor.&#160;Kulisch, Wilhelm. editor.&#160;Popov, Cyril. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-94-017-9697-2">https://doi.org/10.1007/978-94-017-9697-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Issues in Contemporary Oil Paint ent://SD_ILS/0/SD_ILS:530714 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Burnstock, Aviva. editor.&#160;de Keijzer, Matthijs. editor.&#160;Krueger, Jay. editor.&#160;Learner, Tom. editor.&#160;de Tagle, Alberto. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-10100-2">https://doi.org/10.1007/978-3-319-10100-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Physics of Graphene ent://SD_ILS/0/SD_ILS:530718 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Aoki, Hideo. editor.&#160;S. Dresselhaus, Mildred. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-02633-6">https://doi.org/10.1007/978-3-319-02633-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Surface Microscopy with Low Energy Electrons ent://SD_ILS/0/SD_ILS:530807 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Bauer, Ernst. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4939-0935-3">https://doi.org/10.1007/978-1-4939-0935-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Current Trends of Surface Science and Catalysis ent://SD_ILS/0/SD_ILS:530667 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Park, Jeong Young. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-8742-5">https://doi.org/10.1007/978-1-4614-8742-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamics in Geometrical Confinement ent://SD_ILS/0/SD_ILS:530693 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Kremer, Friedrich. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-06100-9">https://doi.org/10.1007/978-3-319-06100-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thin film analysis by X-ray scattering ent://SD_ILS/0/SD_ILS:302207 2025-03-16T05:37:41Z 2025-03-16T05:37:41Z Author&#160;Birkholz, Mario.&#160;Fewster, Paul F.&#160;Genzel, Christoph.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/3527607595">http://dx.doi.org/10.1002/3527607595</a> <a href="http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282">http://www3.interscience.wiley.com/cgi-bin/bookhome/112599282</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>