Search Results for Spectrum Analysis. - Narrowed by: Optical materials.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSpectrum$002bAnalysis.$0026qf$003dSUBJECT$002509Subject$002509Optical$002bmaterials.$002509Optical$002bmaterials.$0026ic$003dtrue$0026ps$003d300?
2024-08-26T12:08:58Z
Semiconductor Optics
ent://SD_ILS/0/SD_ILS:184678
2024-08-26T12:08:58Z
2024-08-26T12:08:58Z
Author Klingshirn, Claus. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-38347-5">http://dx.doi.org/10.1007/978-3-540-38347-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor Optics
ent://SD_ILS/0/SD_ILS:181030
2024-08-26T12:08:58Z
2024-08-26T12:08:58Z
Author Klingshirn, Claus. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b138175">http://dx.doi.org/10.1007/b138175</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Physics of Thin Film Optical Spectra An Introduction
ent://SD_ILS/0/SD_ILS:181597
2024-08-26T12:08:58Z
2024-08-26T12:08:58Z
Author Stenzel, Olaf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-27905-9">http://dx.doi.org/10.1007/3-540-27905-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CCD Image Sensors in Deep-Ultraviolet Degradation Behavior and Damage Mechanisms
ent://SD_ILS/0/SD_ILS:181391
2024-08-26T12:08:58Z
2024-08-26T12:08:58Z
Author Li, Flora M. author. Nathan, Arokia. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b139047">http://dx.doi.org/10.1007/b139047</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>