Search Results for Statistics&nbsp;. - Narrowed by: E-Book - Electronics. - Engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dStatistics$0025C2$0025A0.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list 2024-07-24T01:55:54Z Extreme Statistics in Nanoscale Memory Design ent://SD_ILS/0/SD_ILS:172640 2024-07-24T01:55:54Z 2024-07-24T01:55:54Z Author&#160;Singhee, Amith. editor.&#160;Rutenbar, Rob A. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6606-3">http://dx.doi.org/10.1007/978-1-4419-6606-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-07-24T01:55:54Z 2024-07-24T01:55:54Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332682.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronic Noise and Interfering Signals Principles and Applications ent://SD_ILS/0/SD_ILS:180789 2024-07-24T01:55:54Z 2024-07-24T01:55:54Z Author&#160;Vasilescu, Gabriel. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b137720">http://dx.doi.org/10.1007/b137720</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>