Search Results for Statistics . - Narrowed by: Electronics. - Engineering.
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2024-09-06T22:35:19Z
Extreme Statistics in Nanoscale Memory Design
ent://SD_ILS/0/SD_ILS:172640
2024-09-06T22:35:19Z
2024-09-06T22:35:19Z
Author Singhee, Amith. editor. Rutenbar, Rob A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6606-3">http://dx.doi.org/10.1007/978-1-4419-6606-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability Physics and Engineering Time-To-Failure Modeling
ent://SD_ILS/0/SD_ILS:332682
2024-09-06T22:35:19Z
2024-09-06T22:35:19Z
Author McPherson, J. W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332682.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electronic Noise and Interfering Signals Principles and Applications
ent://SD_ILS/0/SD_ILS:180789
2024-09-06T22:35:19Z
2024-09-06T22:35:19Z
Author Vasilescu, Gabriel. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137720">http://dx.doi.org/10.1007/b137720</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>