Search Results for Statistics -- Textbooks. - Narrowed by: Electronic LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dStatistics$002b--$002bTextbooks.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026te$003dILS$0026ps$003d300?2024-11-03T00:18:57ZAdvanced risk analysis in engineering enterprise systemsent://SD_ILS/0/SD_ILS:2871632024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Pinto, Cesar Ariel. Garvey, Paul R., 1956-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439826157">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Randomized response and indirect questioning techniques in surveysent://SD_ILS/0/SD_ILS:2898422024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Chaudhuri, Arijit, 1940-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439836583">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Bayesian model selection and statistical modelingent://SD_ILS/0/SD_ILS:2915312024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Ando, Tomohiro.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439836156">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Acceptance sampling in quality controlent://SD_ILS/0/SD_ILS:2900102024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Schilling, Edward G., 1931- Neubauer, Dean V.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781584889533">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to spatial econometricsent://SD_ILS/0/SD_ILS:2860472024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor LeSage, James P. Pace, R. Kelley.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420064254">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Confidence intervals in generalized regression modelsent://SD_ILS/0/SD_ILS:2887832024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Uusipaikka, Esa I.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420060386">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Analytical methods for risk management a systems engineering perspectiveent://SD_ILS/0/SD_ILS:2903792024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Garvey, Paul R., 1956-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420011395">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of parallel computing and statisticsent://SD_ILS/0/SD_ILS:2866712024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Kontoghiorghes, Erricos John.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420028683">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A Kalman filter primerent://SD_ILS/0/SD_ILS:2866822024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Eubank, R. L. (Randy L.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420028676">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical inference based on divergence measuresent://SD_ILS/0/SD_ILS:2904652024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Pardo Llorente, Leandro.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420034813">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical methods in computer securityent://SD_ILS/0/SD_ILS:2886112024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Chen, William W. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420030884">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Data analysis of asymmetric structures advanced approaches in computational statisticsent://SD_ILS/0/SD_ILS:2905042024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Saito, Takayuki. Yadohisa, Hiroshi.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420030440">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Survey sampling theory and methodsent://SD_ILS/0/SD_ILS:2867182024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Chaudhuri, Arijit, 1940- Stenger, Horst, 1935-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420028638">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computational methods in statistics and econometricsent://SD_ILS/0/SD_ILS:2901242024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Tanizaki, Hisashi.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203022023">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The EM algorithm and related statistical modelsent://SD_ILS/0/SD_ILS:2856022024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Watanabe, Michiko, 1956- Yamaguchi, Kazunori, 1962-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203913055">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer-aided econometricsent://SD_ILS/0/SD_ILS:2901182024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Giles, David E. A., 1949-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203911570">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of applied econometrics and statistical inferenceent://SD_ILS/0/SD_ILS:2882842024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Ullah, Aman. Wan, Alan T. K., 1966- Chaturvedi, Anoop, 1954-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203911075">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Visualizing statistical models and conceptsent://SD_ILS/0/SD_ILS:2911442024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Farebrother, R. W., 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203908990">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Testing for normalityent://SD_ILS/0/SD_ILS:2874402024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Thode, Henry C., 1951-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203910894">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability on graphs random processes on graphs and latticesent://SD_ILS/0/SD_ILS:2788542024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Grimmett, Geoffrey.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=361597">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=361597</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of statistical distributions with applicationsent://SD_ILS/0/SD_ILS:2904102024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Krishnamoorthy, K. (Kalimuthu)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420011371">Distributed by publisher. 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John Wiley <a href="http://dx.doi.org/10.1002/9780470496862">http://dx.doi.org/10.1002/9780470496862</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to nonparametric regressionent://SD_ILS/0/SD_ILS:3018332024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Takezawa, Kunio, 1959- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471771457">http://dx.doi.org/10.1002/0471771457</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to linear models and statistical inferenceent://SD_ILS/0/SD_ILS:3017872024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Janke, Steven J., 1947- Tinsley, Frederick, 1951- John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0624/2005042843-b.html">http://catdir.loc.gov/catdir/enhancements/fy0624/2005042843-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/047174011X">http://dx.doi.org/10.1002/047174011X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Probability, statistics, and stochastic processesent://SD_ILS/0/SD_ILS:3017962024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Olofsson, Peter, 1963-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708197">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708197</a>
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<a href="http://swb.eblib.com/patron/FullRecord.aspx?p=708197">http://swb.eblib.com/patron/FullRecord.aspx?p=708197</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistics an introduction using Rent://SD_ILS/0/SD_ILS:3019102024-11-03T00:18:57Z2024-11-03T00:18:57ZAuthor Crawley, Michael J. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119941750">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>