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SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dStatistics.$0026qf$003dAUTHOR$002509Author$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Statistics.$002509Statistics.$0026qf$003dSUBJECT$002509Subject$002509System$002bsafety.$002509System$002bsafety.$0026te$003dILS$0026ps$003d300? 2024-09-06T17:08:47Z Statistics for Innovation Statistical Design of &ldquo;Continuous&rdquo; Product Innovation ent://SD_ILS/0/SD_ILS:204305 2024-09-06T17:08:47Z 2024-09-06T17:08:47Z Author&#160;Erto, Pasquale. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-88-470-0815-1">http://dx.doi.org/10.1007/978-88-470-0815-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Permutation Tests for Stochastic Ordering and ANOVA Theory and Applications with R ent://SD_ILS/0/SD_ILS:167802 2024-09-06T17:08:47Z 2024-09-06T17:08:47Z Author&#160;Solari, Aldo. author.&#160;Salmaso, Luigi. author.&#160;Pesarin, Fortunato. author.&#160;Basso, Dario. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-85956-9">http://dx.doi.org/10.1007/978-0-387-85956-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semi-Markov Chains and Hidden Semi-Markov Models toward Applications Their use in Reliability and DNA Analysis ent://SD_ILS/0/SD_ILS:167030 2024-09-06T17:08:47Z 2024-09-06T17:08:47Z Author&#160;Limnios, Nikolaos. author.&#160;Barbu, Vlad Stefan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-73173-5">http://dx.doi.org/10.1007/978-0-387-73173-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Bayesian Reliability ent://SD_ILS/0/SD_ILS:167542 2024-09-06T17:08:47Z 2024-09-06T17:08:47Z Author&#160;Hamada, Michael S. author.&#160;Wilson, Alyson G. author.&#160;Reese, C. 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author.&#160;Finkelstein, Maxim. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-73540-5">https://doi.org/10.1007/978-3-319-73540-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Dynamic Modeling of Complex Industrial Processes: Data-driven Methods and Application Research ent://SD_ILS/0/SD_ILS:402455 2024-09-06T17:08:47Z 2024-09-06T17:08:47Z Author&#160;Shang, Chao. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-10-6677-1">https://doi.org/10.1007/978-981-10-6677-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Strategies and Techniques for Quality and Flexibility ent://SD_ILS/0/SD_ILS:402691 2024-09-06T17:08:47Z 2024-09-06T17:08:47Z Author&#160;Barad, Miryam. author.&#160;SpringerLink (Online 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editor.&#160;Schmid, Wolfgang. editor.&#160;Wilrich, Peter-Theodor. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-7908-2846-7">http://dx.doi.org/10.1007/978-3-7908-2846-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A Unified Statistical Methodology for Modeling Fatigue Damage ent://SD_ILS/0/SD_ILS:170463 2024-09-06T17:08:47Z 2024-09-06T17:08:47Z Author&#160;Castillo, Enrique. author.&#160;Fern&aacute;ndez-Canteli, Alfonso. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-9182-7">http://dx.doi.org/10.1007/978-1-4020-9182-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Failure Rate Modelling for Reliability and Risk ent://SD_ILS/0/SD_ILS:175868 2024-09-06T17:08:47Z 2024-09-06T17:08:47Z 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