Search Results for Surfaces - Narrowed by: Particles (Nuclear physics). SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSurfaces$0026qf$003dSUBJECT$002509Subject$002509Particles$002b$002528Nuclear$002bphysics$002529.$002509Particles$002b$002528Nuclear$002bphysics$002529.$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-25T17:55:47Z Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:188564 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. author.&#160;Fuchs, Harald. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85037-3">http://dx.doi.org/10.1007/978-3-540-85037-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods XIII Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:188568 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85049-6">http://dx.doi.org/10.1007/978-3-540-85049-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> X-ray and Neutron Reflectivity Principles and Applications ent://SD_ILS/0/SD_ILS:189083 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Daillant, Jean. editor.&#160;Gibaud, Alain. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-88588-7">http://dx.doi.org/10.1007/978-3-540-88588-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Mikro- und Nanoskopie der Werkstoffe ent://SD_ILS/0/SD_ILS:189368 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Hornbogen, Erhard. author.&#160;Skrotzki, Birgit. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-89946-4">http://dx.doi.org/10.1007/978-3-540-89946-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Surface and Interface Analysis An Electrochemists Toolbox ent://SD_ILS/0/SD_ILS:185266 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Holze, Rudolf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49829-2">http://dx.doi.org/10.1007/978-3-540-49829-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Laser Spectroscopy Vol. 1 Basic Principles ent://SD_ILS/0/SD_ILS:186844 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Demtr&ouml;der, Wolfgang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73418-5">http://dx.doi.org/10.1007/978-3-540-73418-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Transmission Electron Microscopy and Diffractometry of Materials ent://SD_ILS/0/SD_ILS:186997 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Fultz, Brent. author.&#160;Howe, James M. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Laser Spectroscopy Vol. 2 Experimental Techniques ent://SD_ILS/0/SD_ILS:187317 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Demtr&ouml;der, Wolfgang. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74954-7">http://dx.doi.org/10.1007/978-3-540-74954-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VIII Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:187050 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;Tomitori, Masahiko. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74080-3">http://dx.doi.org/10.1007/978-3-540-74080-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IX Characterization ent://SD_ILS/0/SD_ILS:187051 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Tomitori, Masahiko. editor.&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74083-4">http://dx.doi.org/10.1007/978-3-540-74083-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods X Biomimetics and Industrial Applications ent://SD_ILS/0/SD_ILS:187052 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. editor.&#160;Tomitori, Masahiko. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-74085-8">http://dx.doi.org/10.1007/978-3-540-74085-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods VI Characterization ent://SD_ILS/0/SD_ILS:184524 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf 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H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Electrical and Electromechanical Phenomena at the Nanoscale ent://SD_ILS/0/SD_ILS:165534 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Kalinin, Sergei. editor.&#160;Gruverman, Alexei. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-28668-6">http://dx.doi.org/10.1007/978-0-387-28668-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Suhir, E. editor.&#160;Lee, Y. 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P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-32989-7">http://dx.doi.org/10.1007/0-387-32989-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamentals of Nanoscale Film Analysis ent://SD_ILS/0/SD_ILS:165623 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Alford, Terry L. author.&#160;Feldman, Leonard C. author.&#160;Mayer, James W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:184523 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. editor.&#160;Kawata, Satoshi. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-37316-2">http://dx.doi.org/10.1007/978-3-540-37316-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metalle Struktur und Eigenschaften der Metalle und Legierungen ent://SD_ILS/0/SD_ILS:183904 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Hornbogen, Erhard. author.&#160;Warlimont, Hans. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-34011-4">http://dx.doi.org/10.1007/3-540-34011-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods III Characterization ent://SD_ILS/0/SD_ILS:181079 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138285">http://dx.doi.org/10.1007/b138285</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods IV Industrial Applications ent://SD_ILS/0/SD_ILS:181082 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138289">http://dx.doi.org/10.1007/b138289</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of Practical X-Ray Fluorescence Analysis ent://SD_ILS/0/SD_ILS:184419 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Beckhoff, Burkhard. editor.&#160;Kanngie&szlig;er, habil. Birgit. editor.&#160;Langhoff, Norbert. editor.&#160;Wedell, Reiner. editor.&#160;Wolff, Helmut. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-36722-2">http://dx.doi.org/10.1007/978-3-540-36722-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques ent://SD_ILS/0/SD_ILS:181412 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Bhushan, Bharat. editor.&#160;Fuchs, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b139097">http://dx.doi.org/10.1007/b139097</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Neutron and X-ray Spectroscopy ent://SD_ILS/0/SD_ILS:168875 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Hippert, Fran&ccedil;oise. editor.&#160;Geissler, Erik. editor.&#160;Hodeau, Jean Louis. editor.&#160;Leli&egrave;vre-Berna, Eddy. editor.&#160;Regnard, Jean-Ren&eacute;. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-3337-0">http://dx.doi.org/10.1007/1-4020-3337-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micromachined Thin-Film Sensors for SOI-CMOS Co-Integration ent://SD_ILS/0/SD_ILS:165572 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Laconte, J. author.&#160;Flandre, D. author.&#160;Raskin, J. -P. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-28843-0">http://dx.doi.org/10.1007/0-387-28843-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Planewaves, Pseudopotentials and the LAPW Method ent://SD_ILS/0/SD_ILS:165667 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Singh, David J. author.&#160;Nordstr&ouml;m, Lars. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-29684-5">http://dx.doi.org/10.1007/978-0-387-29684-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents ent://SD_ILS/0/SD_ILS:166196 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Foster, Adam. author.&#160;Hofer, Werner. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-37231-8">http://dx.doi.org/10.1007/0-387-37231-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of Applied Solid State Spectroscopy ent://SD_ILS/0/SD_ILS:166204 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Vij, D. R. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/0-387-37590-2">http://dx.doi.org/10.1007/0-387-37590-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solid State NMR Spectroscopy for Biopolymers Principles and Applications ent://SD_ILS/0/SD_ILS:169139 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Sait&ocirc;, Hazime. author.&#160;Ando, Isao. author.&#160;Naito, Akira. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-4020-4303-1">http://dx.doi.org/10.1007/1-4020-4303-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Surface-Enhanced Raman Scattering Physics and Applications ent://SD_ILS/0/SD_ILS:183772 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Kneipp, Katrin. editor.&#160;Moskovits, Martin. editor.&#160;Kneipp, Harald. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-33567-6">http://dx.doi.org/10.1007/3-540-33567-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Spectroscopic Properties of Rare Earths in Optical Materials ent://SD_ILS/0/SD_ILS:181676 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Hull, Robert. editor.&#160;Parisi, J&uuml;rgen. editor.&#160;Osgood, R. M. editor.&#160;Warlimont, Hans. editor.&#160;Liu, Guokui. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-28209-2">http://dx.doi.org/10.1007/3-540-28209-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Thin Films and Heterostructures for Oxide Electronics ent://SD_ILS/0/SD_ILS:165225 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Ogale, Satischandra B. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b136780">http://dx.doi.org/10.1007/b136780</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Introduction to Focused Ion Beams Instrumentation, Theory, Techniques and Practice ent://SD_ILS/0/SD_ILS:164892 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Giannuzzi, Lucille A. editor.&#160;Stevie, Fred A. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b101190">http://dx.doi.org/10.1007/b101190</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Materials for Information Technology Devices, Interconnects and Packaging ent://SD_ILS/0/SD_ILS:175333 2024-12-25T17:55:47Z 2024-12-25T17:55:47Z Author&#160;Zschech, Ehrenfried. editor.&#160;Whelan, Caroline. editor.&#160;Mikolajick, Thomas. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-235-7">http://dx.doi.org/10.1007/1-84628-235-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>