Search Results for Surfaces (Physics). - Narrowed by: Weights and measures. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSurfaces$002b$002528Physics$002529.$0026qf$003dSUBJECT$002509Subject$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026te$003dILS$0026ps$003d300?dt=list 2024-12-22T20:46:54Z Particle Size Measurements Fundamentals, Practice, Quality ent://SD_ILS/0/SD_ILS:170410 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Merkus, Henk G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-9016-5">http://dx.doi.org/10.1007/978-1-4020-9016-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Surface and Interface Analysis An Electrochemists Toolbox ent://SD_ILS/0/SD_ILS:185266 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Holze, Rudolf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49829-2">http://dx.doi.org/10.1007/978-3-540-49829-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Standardization and Quality Assurance in Fluorescence Measurements I Techniques ent://SD_ILS/0/SD_ILS:187362 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Resch-Genger, Ute. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-75207-3">http://dx.doi.org/10.1007/978-3-540-75207-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Standardization and Quality Assurance in Fluorescence Measurements II Bioanalytical and Biomedical Applications ent://SD_ILS/0/SD_ILS:185993 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Resch-Genger, Ute. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-70571-0">http://dx.doi.org/10.1007/978-3-540-70571-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Atomic and Nuclear Analytical Methods XRF, M&ouml;ssbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques ent://SD_ILS/0/SD_ILS:182285 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Verma, H. R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-30279-7">http://dx.doi.org/10.1007/978-3-540-30279-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Very High Resolution Photoelectron Spectroscopy ent://SD_ILS/0/SD_ILS:185367 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;H&uuml;fner, Stefan. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-68133-7">http://dx.doi.org/10.1007/3-540-68133-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Science of Microscopy ent://SD_ILS/0/SD_ILS:166500 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Hawkes, Peter W. editor.&#160;Spence, John C. H. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-49762-4">http://dx.doi.org/10.1007/978-0-387-49762-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Inorganic Scintillators for Detector Systems Physical Principles and Crystal Engineering ent://SD_ILS/0/SD_ILS:181566 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Lecoq, Paul. author.&#160;Annenkov, Alexander. author.&#160;Gektin, Alexander. author.&#160;Korzhik, Mikhail. author.&#160;Pedrini, Christian. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/3-540-27768-4">http://dx.doi.org/10.1007/3-540-27768-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanoscale Devices - Fundamentals and Applications ent://SD_ILS/0/SD_ILS:169377 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Gross, Rudolf. editor.&#160;Sidorenko, Anatolie. editor.&#160;Tagirov, Lenar. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4020-5107-4">http://dx.doi.org/10.1007/978-1-4020-5107-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integrated Chemical Microsensor Systems in CMOS Technology ent://SD_ILS/0/SD_ILS:181372 2024-12-22T20:46:54Z 2024-12-22T20:46:54Z Author&#160;Hierlemann, Andreas. author.&#160;Baltes, H. editor.&#160;Fujita, Hiroyuki. editor.&#160;Liepmann, Dorian. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138987">http://dx.doi.org/10.1007/b138987</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>