Search Results for Surfaces. - Narrowed by: Measurement Science and Instrumentation. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSurfaces.$0026qf$003dSUBJECT$002509Subject$002509Measurement$002bScience$002band$002bInstrumentation.$002509Measurement$002bScience$002band$002bInstrumentation.$0026ps$003d300? 2025-12-29T00:39:54Z Fly Cutting Technology for Ultra-precision Machining ent://SD_ILS/0/SD_ILS:527252 2025-12-29T00:39:54Z 2025-12-29T00:39:54Z Author&#160;To, Suet. editor.&#160;Wang, Sujuan. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-99-0738-0">https://doi.org/10.1007/978-981-99-0738-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Characterisation of Ferroelectric Bulk Materials and Thin Films ent://SD_ILS/0/SD_ILS:530661 2025-12-29T00:39:54Z 2025-12-29T00:39:54Z Author&#160;Cain, Markys G. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4020-9311-1">https://doi.org/10.1007/978-1-4020-9311-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Evaluating Measurement Accuracy A Practical Approach ent://SD_ILS/0/SD_ILS:332097 2025-12-29T00:39:54Z 2025-12-29T00:39:54Z Author&#160;Rabinovich, Semyon G. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332097.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-6717-5">http://dx.doi.org/10.1007/978-1-4614-6717-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Ellipsometry at the Nanoscale ent://SD_ILS/0/SD_ILS:333782 2025-12-29T00:39:54Z 2025-12-29T00:39:54Z Author&#160;Losurdo, Maria. editor.&#160;Hingerl, Kurt. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333782.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nondestructive Testing of Materials and Structures ent://SD_ILS/0/SD_ILS:335698 2025-12-29T00:39:54Z 2025-12-29T00:39:54Z Author&#160;B&uuml;y&uuml;k&ouml;zt&uuml;rk, Oral. author.&#160;Ta&#351;demir, Mehmet Ali. author.&#160;G&uuml;ne&#351;, O&#287;uz. editor.&#160;Akkaya, Y&#305;lmaz. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335698.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-0723-8">http://dx.doi.org/10.1007/978-94-007-0723-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation ent://SD_ILS/0/SD_ILS:330843 2025-12-29T00:39:54Z 2025-12-29T00:39:54Z Author&#160;Sabbagh, Harold A. author.&#160;Murphy, R. Kim. author.&#160;Sabbagh, Elias H. author.&#160;Aldrin, John C. author.&#160;Knopp, Jeremy S. author.<br/>Preferred Shelf Number&#160;ONLINE(330843.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-8429-6">http://dx.doi.org/10.1007/978-1-4419-8429-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>