Search Results for System failures (Engineering). - Narrowed by: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSystem$002bfailures$002b$002528Engineering$002529.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ps$003d300$0026isd$003dtrue?2026-01-23T12:30:46ZThe seven bad habits of safety management : examining systemic failureent://SD_ILS/0/SD_ILS:5889652026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Ritchie, Murray (Occupational health and safety practitioner), author.<br/>Preferred Shelf Number T55<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003404958">https://www.taylorfrancis.com/books/9781003404958</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Functional safety of machinery : how to apply ISO 13849-1 and IEC 62061ent://SD_ILS/0/SD_ILS:5982692026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Tacchini, Marco, author.<br/>Preferred Shelf Number TJ211.5 .T33 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119789123</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fault analysis and its impact on grid-connected photovoltaic systems performanceent://SD_ILS/0/SD_ILS:5980212026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Haque, Ahteshamul, editor. Mekhilef, Saad, editor.<br/>Preferred Shelf Number TA169.5 .F38 2023 EB<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119873785">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119873785</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Model-based systems architecting : using CESAM to architect complex systemsent://SD_ILS/0/SD_ILS:5976502026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Krob, Daniel, author.<br/>Preferred Shelf Number QA76.9 .S88<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988496">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119988496</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability engineeringent://SD_ILS/0/SD_ILS:5961622026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Elsayed, Elsayed A., author.<br/>Preferred Shelf Number TA169 .E52 2021<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119665946</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electrical systems. 1 : From diagnosis to prognosisent://SD_ILS/0/SD_ILS:5959552026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Soualhi, Abdenour. Razik, Hubert.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720317">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720317</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electrical systems. 2 : from diagnosis to prognosisent://SD_ILS/0/SD_ILS:5959572026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Soualhi, Abdenour. Razik, Hubert.<br/>Preferred Shelf Number TA169.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720584">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119720584</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Methods for reliability improvement and risk reductionent://SD_ILS/0/SD_ILS:5946972026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Todinov, M. T., author.<br/>Preferred Shelf Number TA169 .T649 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119477624</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Risk assessment : tools, techniques, and their applicationsent://SD_ILS/0/SD_ILS:5953792026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Ostrom, Lee T., author. Wilhelmsen, Cheryl A., 1953- author.<br/>Preferred Shelf Number TA169.55 .R57 O88 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119483342">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119483342</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of maintained systems subjected to wear failure mechanisms : theory and applicationsent://SD_ILS/0/SD_ILS:5952402026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Bayle, Franck, author.<br/>Preferred Shelf Number TA169<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119610717</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Forensic systems engineering : evaluating operations by discoveryent://SD_ILS/0/SD_ILS:5939322026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Stimson, William A., author.<br/>Preferred Shelf Number TA169.5 .S755 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119422808</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Recognizing and responding to normalization of devianceent://SD_ILS/0/SD_ILS:5947402026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor American Institute of Chemical Engineers. Center for Chemical Process Safety, issuing body.<br/>Preferred Shelf Number TA169.5 .R43 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506638">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119506638</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Emergent behavior in complex systems engineering : a modeling and simulation approachent://SD_ILS/0/SD_ILS:5942062026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Mittal, Saurabh, editor. Diallo, Saikou Y., editor. Tolk, Andreas, editor.<br/>Preferred Shelf Number TA168 .E53 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119378952">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119378952</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Field Guide to Understanding 'Human Error'ent://SD_ILS/0/SD_ILS:5405172026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Dekker, Sidney.<br/>Preferred Shelf Number TA169.5 .D45 2014<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781317031840">https://www.taylorfrancis.com/books/e/9781317031840</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/e/9781315558172">https://www.taylorfrancis.com/books/e/9781315558172</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781315558172">https://www.taylorfrancis.com/books/9781315558172</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:3554852026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Ohring, Milton, 1936- Kasprzak, Lucian.<br/>Preferred Shelf Number ONLINE(355485.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780120885749">http://www.sciencedirect.com/science/book/9780120885749</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>IAENG transactions on engineering sciences : special issue of the International Multiconference of Engineers and Computer Scientists 2013 and World Congress on Engineering 2013ent://SD_ILS/0/SD_ILS:5393612026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor International Multi-Conference of Engineers and Computer Scientists (2013). author. Ao, Sio-Iong, editor. Chan, Alan Hoi-Shou, editor. Katagiri, Hideki, editor. Xu, Li D., editor.<br/>Preferred Shelf Number TA5 .I58 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315761817">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Systems engineering and safety : building the bridgeent://SD_ILS/0/SD_ILS:5397172026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Glismann, Peter J., author.<br/>Preferred Shelf Number TA169 .G54 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466552135">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>PEM fuel cell failure mode analysisent://SD_ILS/0/SD_ILS:5427762026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Wang, Haijiang Henry. Li, Hui, 1964- Yuan, Xiao-Zi.<br/>Preferred Shelf Number TK2933 .P76 P465 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439839188">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Machine learning and knowledge discovery for engineering systems health managementent://SD_ILS/0/SD_ILS:5450902026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Srivastava, Ashok N. (Ashok Narain), 1969- Han, Jiawei.<br/>Preferred Shelf Number TA169.5 .M33 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439841792">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Reliability technology principles and practice of failure prevention in electronic systemsent://SD_ILS/0/SD_ILS:2988172026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Pascoe, Norman.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://proquest.safaribooksonline.com/?fpi=9781119991366">Available by subscription from Safari Books Online</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470980101">http://dx.doi.org/10.1002/9780470980101</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470980101">http://onlinelibrary.wiley.com/book/10.1002/9780470980101</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41740">http://www.books24x7.com/marc.asp?bookid=41740</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Failure analysis a practical guide for manufacturers of electronic components and systemsent://SD_ILS/0/SD_ILS:3056902026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Bâzu, M. I. (Marius I.), 1948- Băjenescu, Titu I., 1938-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781119990093">http://dx.doi.org/10.1002/9781119990093</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41699">http://www.books24x7.com/marc.asp?bookid=41699</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Spacecraft reliability and multi-state failures a statistical approachent://SD_ILS/0/SD_ILS:3057212026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Saleh, Joseph H., 1971- Castet, Jean-François. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119994077">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697462">Click here to view book</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41710">http://www.books24x7.com/marc.asp?bookid=41710</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510309">http://site.ebrary.com/lib/alltitles/Doc?id=10510309</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Verification, validation, and testing of engineered systemsent://SD_ILS/0/SD_ILS:2980102026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Engel, Avner.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=35180">http://www.books24x7.com/marc.asp?bookid=35180</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470618851">http://dx.doi.org/10.1002/9780470618851</a>
<a href="http://onlinelibrary.wiley.com/book/10.1002/9780470618851">http://onlinelibrary.wiley.com/book/10.1002/9780470618851</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9781118029312">http://proquest.safaribooksonline.com/?fpi=9781118029312</a>
<a href="http://proquest.safaribooksonline.com/9781118029312">http://proquest.safaribooksonline.com/9781118029312</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mathematical models for systems reliabilityent://SD_ILS/0/SD_ILS:5389052026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Epstein, Benjamin, 1918, author. Weissman, Ishay, 1940-<br/>Preferred Shelf Number TA169 .E67 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420080834">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Risk-based reliability analysis and generic principles for risk reductionent://SD_ILS/0/SD_ILS:1489562026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Todinov, M. T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080447285">http://www.sciencedirect.com/science/book/9780080447285</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Practical plant failure analysis : a guide to understanding machinery deterioration and improving equipment reliabilityent://SD_ILS/0/SD_ILS:5409782026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Sachs, Neville W., author.<br/>Preferred Shelf Number TJ153 .S164 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420020007">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Wood Pole Overhead Linesent://SD_ILS/0/SD_ILS:2479092026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Wareing, Brian<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBPO048E">http://dx.doi.org/10.1049/PBPO048E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power distribution planning reference bookent://SD_ILS/0/SD_ILS:5419572026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Willis, H. Lee, 1949, author.<br/>Preferred Shelf Number TK3091 .W55 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420030310">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Investigation of aeronautical and engineering component failuresent://SD_ILS/0/SD_ILS:5392522026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Reddy, A. Venugopal., author.<br/>Preferred Shelf Number TL672 .R44 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781136968525">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Practical engineering failure analysisent://SD_ILS/0/SD_ILS:5453092026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Tawancy, Hani M., author. Abbas, Nureddin Mohamed. Ul-Hamid, Anwar.<br/>Preferred Shelf Number TA169.5 .T39 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135523695">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Root cause failure analysisent://SD_ILS/0/SD_ILS:1537712026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Mobley, R. Keith, 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750671583">http://www.sciencedirect.com/science/book/9780750671583</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design reliability : fundamentals and applicationsent://SD_ILS/0/SD_ILS:5405722026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Dhillon, B. S. (Balbir S.), 1947-<br/>Preferred Shelf Number TA174 .D4929 1999<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781420050141">https://www.taylorfrancis.com/books/9781420050141</a>
Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367802400">https://www.taylorfrancis.com/books/9780367802400</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability and failure of electronic materials and devicesent://SD_ILS/0/SD_ILS:2563092026-01-23T12:30:46Z2026-01-23T12:30:46ZAuthor Ohring, Milton, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125249850">http://www.sciencedirect.com/science/book/9780125249850</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>