Search Results for System safety. - Narrowed by: SpringerLink (Online service) - Tan, Cher Ming. author.
SirsiDynix Enterprise
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2024-06-24T20:49:47Z
Electromigration Modeling at Circuit Layout Level
ent://SD_ILS/0/SD_ILS:336507
2024-06-24T20:49:47Z
2024-06-24T20:49:47Z
Author Tan, Cher Ming. author. He, Feifei. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(336507.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-981-4451-21-5">http://dx.doi.org/10.1007/978-981-4451-21-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections
ent://SD_ILS/0/SD_ILS:168486
2024-06-24T20:49:47Z
2024-06-24T20:49:47Z
Author Tan, Cher Ming. author. Li, Wei. author. Gan, Zhenghao. author. Hou, Yuejin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>