Search Results for System safety. - Narrowed by: Electronics. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSystem$002bsafety.$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026te$003dILS$0026ps$003d300? 2024-11-13T18:00:11Z Dependable Multicore Architectures at Nanoscale ent://SD_ILS/0/SD_ILS:402190 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Ottavi, Marco. editor.&#160;Gizopoulos, Dimitris. editor.&#160;Pontarelli, Salvatore. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-54422-9">https://doi.org/10.1007/978-3-319-54422-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:332682 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;McPherson, J. W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332682.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00122-7">http://dx.doi.org/10.1007/978-3-319-00122-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The ELFNET Book on Failure Mechanisms, Testing Methods, and Quality Issues of Lead-Free Solder Interconnects ent://SD_ILS/0/SD_ILS:168463 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Grossmann, G&uuml;nter. editor.&#160;Zardini, Christian. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-236-0">http://dx.doi.org/10.1007/978-0-85729-236-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections ent://SD_ILS/0/SD_ILS:168486 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Tan, Cher Ming. author.&#160;Li, Wei. author.&#160;Gan, Zhenghao. author.&#160;Hou, Yuejin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-85729-310-7">http://dx.doi.org/10.1007/978-0-85729-310-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability of Microtechnology Interconnects, Devices and Systems ent://SD_ILS/0/SD_ILS:172420 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Liu, Johan. author.&#160;Salmela, Olli. author.&#160;Sarkka, Jussi. author.&#160;Morris, James E. author.&#160;Tegehall, Per-Erik. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-5760-3">http://dx.doi.org/10.1007/978-1-4419-5760-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:192824 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-14952-8">http://dx.doi.org/10.1007/978-3-642-14952-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Physics and Engineering Time-To-Failure Modeling ent://SD_ILS/0/SD_ILS:172571 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;McPherson, J.W. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4419-6348-2">http://dx.doi.org/10.1007/978-1-4419-6348-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Reliability Prediction for Multiple Environments ent://SD_ILS/0/SD_ILS:167673 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Perkins, Andrew E. author.&#160;Sitaraman, Suresh K. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-79394-8">http://dx.doi.org/10.1007/978-0-387-79394-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Montage in der Leistungselektronik f&uuml;r globale M&auml;rkte Design, Konzepte, Strategien ent://SD_ILS/0/SD_ILS:188952 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Feldmann, Klaus. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-87972-5">http://dx.doi.org/10.1007/978-3-540-87972-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Precision Manufacturing ent://SD_ILS/0/SD_ILS:166555 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Dornfeld, David. author.&#160;Lee, Dae-Eun. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-68208-2">http://dx.doi.org/10.1007/978-0-387-68208-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Emerging Nanotechnologies Test, Defect Tolerance, and Reliability ent://SD_ILS/0/SD_ILS:167204 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Tehranipoor, Mohammad. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro- and Opto-Electronic Materials and Structures: Physics, Mechanics, Design, Reliability, Packaging ent://SD_ILS/0/SD_ILS:165900 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Suhir, E. editor.&#160;Lee, Y. 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N. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-48433-4">http://dx.doi.org/10.1007/978-0-387-48433-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A Guide to Lead-free Solders Physical Metallurgy and Reliability ent://SD_ILS/0/SD_ILS:175373 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Evans, John W. author.&#160;Engelmaier, Werner. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-84628-310-9">http://dx.doi.org/10.1007/978-1-84628-310-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Solder Joint Technology Materials, Properties, and Reliability ent://SD_ILS/0/SD_ILS:166252 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Tu, King-Ning. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-0-387-38892-2">http://dx.doi.org/10.1007/978-0-387-38892-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability Engineering Theory and Practice ent://SD_ILS/0/SD_ILS:185203 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Birolini, Alessandro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-49390-7">http://dx.doi.org/10.1007/978-3-540-49390-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electronics Process Technology Production Modelling, Simulation and Optimisation ent://SD_ILS/0/SD_ILS:175397 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Sauer, Wilfried. author.&#160;Oppermann, Martin. author.&#160;Werner, Sebastian. author.&#160;Wohlrabe, Heinz. author.&#160;Zerna, Thomas. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-354-X">http://dx.doi.org/10.1007/1-84628-354-X</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Force Sensors for Microelectronic Packaging Applications ent://SD_ILS/0/SD_ILS:181096 2024-11-13T18:00:11Z 2024-11-13T18:00:11Z Author&#160;Schwizer, J&uuml;rg. author.&#160;Mayer, Michael. author.&#160;Brand, Oliver. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138345">http://dx.doi.org/10.1007/b138345</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>