Search Results for System safety. - Narrowed by: Systems engineering.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSystem$002bsafety.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026te$003dILS$0026ps$003d300?dt=list2024-12-22T15:41:28ZElectronics System Design Techniques for Safety Critical Applicationsent://SD_ILS/0/SD_ILS:1703972024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Sterpone, Luca. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8979-4">http://dx.doi.org/10.1007/978-1-4020-8979-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Dependable Multicore Architectures at Nanoscaleent://SD_ILS/0/SD_ILS:4021902024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Ottavi, Marco. editor. Gizopoulos, Dimitris. editor. Pontarelli, Salvatore. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-54422-9">https://doi.org/10.1007/978-3-319-54422-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analysesent://SD_ILS/0/SD_ILS:4011882024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Kochs, Hans-Dieter. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-64991-7">https://doi.org/10.1007/978-3-319-64991-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Systems engineering and safety building the bridgeent://SD_ILS/0/SD_ILS:2890772024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Glismann, Peter J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466552135">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Reliability of Nanoscale Circuits and Systems Methodologies and Circuit Architecturesent://SD_ILS/0/SD_ILS:1725302024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Stanisavljević, Miloš. author. Schmid, Alexandre. author. Leblebici, Yusuf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-6217-1">http://dx.doi.org/10.1007/978-1-4419-6217-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design and Verification of Microprocessor Systems for High-Assurance Applicationsent://SD_ILS/0/SD_ILS:1722772024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Hardin, David S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-1539-9">http://dx.doi.org/10.1007/978-1-4419-1539-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Securing Electricity Supply in the Cyber Age Exploring the Risks of Information and Communication Technology in Tomorrow's Electricity Infrastructureent://SD_ILS/0/SD_ILS:2051262024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Lukszo, Zofia. editor. Deconinck, Geert. editor. Weijnen, Margot P. C. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-3594-3">http://dx.doi.org/10.1007/978-90-481-3594-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Architecting resilient systems accident avoidance and survival and recovery from disruptionsent://SD_ILS/0/SD_ILS:2978302024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Jackson, Scott.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469532</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470544013">http://dx.doi.org/10.1002/9780470544013</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10355233">http://site.ebrary.com/lib/alltitles/Doc?id=10355233</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Improvement in the Quality of Delivery of Electrical Energy using Power Electronics Systemsent://SD_ILS/0/SD_ILS:1754932024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Benysek, Grzegorz. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84628-649-0">http://dx.doi.org/10.1007/978-1-84628-649-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Writing Testbenches using System Verilogent://SD_ILS/0/SD_ILS:1658092024-12-22T15:41:28Z2024-12-22T15:41:28ZAuthor Bergeron, Janick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-31275-7">http://dx.doi.org/10.1007/0-387-31275-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>