Search Results for Systems engineering. - Narrowed by: SpringerLink (Online service) - English - Electronic Library - Electronic Circuits and Devices. - Physics. - Systems engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dSystems$002bengineering.$0026qf$003dAUTHOR$002509Author$002509SpringerLink$002b$002528Online$002bservice$002529$002509SpringerLink$002b$002528Online$002bservice$002529$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bCircuits$002band$002bDevices.$002509Electronic$002bCircuits$002band$002bDevices.$0026qf$003dSUBJECT$002509Subject$002509Physics.$002509Physics.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-08-25T13:59:56Z Factors Governing Tin Whisker Growth ent://SD_ILS/0/SD_ILS:332756 2024-08-25T13:59:56Z 2024-08-25T13:59:56Z Author&#160;Crandall, Erika R. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332756.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00470-9">http://dx.doi.org/10.1007/978-3-319-00470-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Variation-Aware Adaptive Voltage Scaling for Digital CMOS Circuits ent://SD_ILS/0/SD_ILS:336184 2024-08-25T13:59:56Z 2024-08-25T13:59:56Z Author&#160;Wirnshofer, Martin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(336184.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-6196-4">http://dx.doi.org/10.1007/978-94-007-6196-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High Mobility and Quantum Well Transistors Design and TCAD Simulation ent://SD_ILS/0/SD_ILS:336218 2024-08-25T13:59:56Z 2024-08-25T13:59:56Z Author&#160;Hellings, Geert. author.&#160;De Meyer, Kristin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(336218.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-6340-1">http://dx.doi.org/10.1007/978-94-007-6340-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors ent://SD_ILS/0/SD_ILS:336233 2024-08-25T13:59:56Z 2024-08-25T13:59:56Z Author&#160;Im, Seongil. author.&#160;Chang, Youn-Gyoung. author.&#160;Kim, Jae Hoon. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(336233.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-6392-0">http://dx.doi.org/10.1007/978-94-007-6392-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>