Search Results for Test. - Narrowed by: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTest.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300?2026-02-22T09:24:37ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Preferred Shelf Number R834.5<br/>Electronic Access Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lowenthal, Michael. Project Muse.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Dietel, Ron. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Aquifer test modelingent://SD_ILS/0/SD_ILS:5450382026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Walton, William Clarence., author.<br/>Preferred Shelf Number GB1199 .W345 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420042931">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>The Turing test argumentent://SD_ILS/0/SD_ILS:5781672026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Gonçalves, Bernardo, author.<br/>Preferred Shelf Number Q341 .G66 2024<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003300267">https://www.taylorfrancis.com/books/9781003300267</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Türkisch-Artikulations-Test (TAT)ent://SD_ILS/0/SD_ILS:1907452026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Nas, Vasfi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03812-9">http://dx.doi.org/10.1007/978-3-642-03812-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nurses! test yourself in pathophysiologyent://SD_ILS/0/SD_ILS:2785562026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Rogers, Katherine M. A. Scott, William N.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=382478</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nurses! test yourself in anatomy & physiologyent://SD_ILS/0/SD_ILS:2787132026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Rogers, Katherine. Scott, William.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=369031</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Building a successful board-test strategyent://SD_ILS/0/SD_ILS:1538072026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Scheiber, Stephen F.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750672801">http://www.sciencedirect.com/science/book/9780750672801</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Studying a study & testing a testent://SD_ILS/0/SD_ILS:3214062026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Riegelman, Richard K. Riegelman, Richard K. Studying a study and testing a test. Ovid Technologies, Inc.<br/>Preferred Shelf Number ONLINE(321406.1)<br/>Electronic Access <a href="http://ovidsp.ovid.com/ovidweb.cgi?T=JS&PAGE=booktext&NEWS=N&DF=bookdb&AN=01787340/6th_Edition&XPATH=/PG(0)">Authentication may be required:</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Clinical integration of neuropsychological test resultsent://SD_ILS/0/SD_ILS:5627292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Golden, Charles J., 1949- editor. Bennett, Ryan (Ryan D.), editor.<br/>Preferred Shelf Number RC386.6 .N48<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003309604">https://www.taylorfrancis.com/books/9781003309604</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cutaneous Cytology and Tzanck Smear Testent://SD_ILS/0/SD_ILS:4844962026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Durdu, Murat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-10722-2">https://doi.org/10.1007/978-3-030-10722-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4853322026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-97460-6">https://doi.org/10.1007/978-3-319-97460-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4881032026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-45352-6">https://doi.org/10.1007/978-3-642-45352-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Automatic Generation of Combinatorial Test Dataent://SD_ILS/0/SD_ILS:4893132026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Zhang, Jian. author. Zhang, Zhiqiang. author. Ma, Feifei. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-43429-1">https://doi.org/10.1007/978-3-662-43429-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>How to Reliably Test for GMOsent://SD_ILS/0/SD_ILS:1739272026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Žel, Jana. author. Milavec, Mojca. author. Morisset, Dany. author. Plan, Damien. author. Van den Eede, Guy. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1390-5">http://dx.doi.org/10.1007/978-1-4614-1390-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microelectronic Test Structures for CMOS Technologyent://SD_ILS/0/SD_ILS:1731932026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Usability testing essentials ready, set-- testent://SD_ILS/0/SD_ILS:1469122026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Barnum, Carol M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123750921">http://www.sciencedirect.com/science/book/9780123750921</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VMware certified professional test prepent://SD_ILS/0/SD_ILS:5386982026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Ilgenfritz, Merle., author. Ilgenfritz, John. Powell, John. Baca, Steven.<br/>Preferred Shelf Number QA76.3 .I56 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420066005">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Test und Verlässlichkeit von Rechnernent://SD_ILS/0/SD_ILS:1862602026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kemnitz, Günter. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-71355-5">http://dx.doi.org/10.1007/978-3-540-71355-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of Pap Test Cytologyent://SD_ILS/0/SD_ILS:1747032026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hoda, Rana S. author. Hoda, Syed A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-59745-276-2">http://dx.doi.org/10.1007/978-1-59745-276-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Analysis of Web Servicesent://SD_ILS/0/SD_ILS:1866862026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Integrated Circuit Test Engineering Modern Techniquesent://SD_ILS/0/SD_ILS:1752902026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Grout, Ian A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Linear Models for Optimal Test Designent://SD_ILS/0/SD_ILS:1655992026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Linden, Wim J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-29054-0">http://dx.doi.org/10.1007/0-387-29054-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Kernel method of test equatingent://SD_ILS/0/SD_ILS:1441742026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Davier, Alina A. von. Holland, Paul W. Thayer, Dorothy T.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=107930</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defining Shakespeare Pericles as test caseent://SD_ILS/0/SD_ILS:2318822026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Jackson, MacDonald P. (MacDonald Pairman)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Oxford scholarship online <a href="http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001">http://dx.doi.org/10.1093/acprof:oso/9780199260508.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Demystifying mixed-signal test methodsent://SD_ILS/0/SD_ILS:2547112026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Baker, Mark.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750676168">http://www.sciencedirect.com/science/book/9780750676168</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test theory a unified treatmentent://SD_ILS/0/SD_ILS:1449762026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor McDonald, Roderick P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9781410601087">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of mutagenicity test proceduresent://SD_ILS/0/SD_ILS:2511892026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kilbey, B. J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444805195">http://www.sciencedirect.com/science/book/9780444805195</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Physicsent://SD_ILS/0/SD_ILS:2940242026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Caputo, Christine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-physics">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940252026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Muntone, Stephanie.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature-2nd-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940262026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Evangelist, Thomas A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-3rd-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Chemistryent://SD_ILS/0/SD_ILS:2940552026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Evangelist, Thomas A. Evangelist, Thomas A. McGraw-Hill's SAT II chemistry.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-2ed">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's MAT Miller analogies testent://SD_ILS/0/SD_ILS:2940472026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Zahler, Kathy A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-mat-miller-analogies-test-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Literatureent://SD_ILS/0/SD_ILS:2940512026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Muntone, Stephanie.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-literature">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electrical connectors : design, manufacture, test, and selectionent://SD_ILS/0/SD_ILS:5961722026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Pecht, Michael, editor. Kyeong, San, editor.<br/>Preferred Shelf Number TK3521<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119679837</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:5303292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nurses! Test Yourself In Non-Medical Prescribingent://SD_ILS/0/SD_ILS:2798342026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Harris, Noel. Shearer, Diane.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Diagnosis for Small-Delay Defectsent://SD_ILS/0/SD_ILS:1731082026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:5372362026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Broemeling, Lyle D., 1939, author.<br/>Preferred Shelf Number RC71.3 .A38 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439838792">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Advanced Bayesian methods for medical test accuracyent://SD_ILS/0/SD_ILS:5467662026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Broemeling, Lyle D., 1939, author.<br/>Preferred Shelf Number RC71.3 .A38 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439838792">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Design Driven Testing Test Smarter, Not Harderent://SD_ILS/0/SD_ILS:1714082026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4302-2944-5">http://dx.doi.org/10.1007/978-1-4302-2944-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineered concrete : mix design and test methodsent://SD_ILS/0/SD_ILS:5391942026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kett, Irving., author.<br/>Preferred Shelf Number TA442.5 .K48 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420091175">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Electronic design automation synthesis, verification, and testent://SD_ILS/0/SD_ILS:1465382026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Wang, Laung-Terng. Chang, Yao-Wen. Cheng, Kwang-Ting, 1961-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123743640">http://www.sciencedirect.com/science/book/9780123743640</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test Pattern Generation using Boolean Proof Enginesent://SD_ILS/0/SD_ILS:2047652026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Emerging Nanotechnologies Test, Defect Tolerance, and Reliabilityent://SD_ILS/0/SD_ILS:1672042026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical test theory for the behavioral sciencesent://SD_ILS/0/SD_ILS:5440312026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Gruijter, Dato N. de., author. Kamp, Leo J. Th. van der.<br/>Preferred Shelf Number H61.25 .G78 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781584889595">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Oscillation-Based Test in Mixed-Signal Circuitsent://SD_ILS/0/SD_ILS:1694322026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Engineered concrete : mix design and test methodsent://SD_ILS/0/SD_ILS:5471942026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kett, Irving., author.<br/>Preferred Shelf Number TA442.5 .K48 2000<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420049831">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Well test analysis for fractured reservoir evaluationent://SD_ILS/0/SD_ILS:2554672026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Da Prat, Giovanni.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444886910">http://www.sciencedirect.com/science/book/9780444886910</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cochrane handbook for systematic reviews of diagnostic test accuracyent://SD_ILS/0/SD_ILS:5981362026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Deeks, Jonathan J., editor. Bossuyt, Patrick, editor. Leeflang, Mariska M., editor. Takwoingi, Yemisi, editor. Cochrane Collaboration, publisher.<br/>Preferred Shelf Number RC71.5 .C6 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119756194">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119756194</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of 3D integration. Volume 4, Design, test, and thermal managementent://SD_ILS/0/SD_ILS:5950512026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Franzon, Paul D., editor. Marinissen, Eric Jan, editor. Bakir, Muhannad S., editor.<br/>Preferred Shelf Number TK7874.893 .H36 2019<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527697052</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software Test Attacks to Break Mobile and Embedded Devices.ent://SD_ILS/0/SD_ILS:5396352026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hagar, Jon Duncan, author. CRC Press LLC.<br/>Preferred Shelf Number QA76.9 .A25 H343 2017<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429071911">https://www.taylorfrancis.com/books/9780429071911</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP statistics questions to know by test dayent://SD_ILS/0/SD_ILS:2938232026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Phan, Jennifer. Balachandran, Divya. Walker, Jerimi Ann.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-statistics-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP calculus AB/BC questions to know by test dayent://SD_ILS/0/SD_ILS:2938252026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Miner, Zachary. Folwaczny, Lena.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-calculus-abbc-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mcgraw-Hill's 500 MCAT organic chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2940162026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Moore, John T., 1947- Langley, Richard.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-organic-chemistry-questions-to-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's GRE Graduate Record Examination general testent://SD_ILS/0/SD_ILS:2940202026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Dulan, Steven W. Advantage Education (Firm)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-gre-2013-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2938292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lebitz, Mina.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-chemistry-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP human geography questions to know by test dayent://SD_ILS/0/SD_ILS:2938322026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Flowers, Jason. Zavar, Elyse. Zimmer, Jessica.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-human-geography-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SSAT/ISEE Secondary School Admission Test/Independent School Entrance Examinationent://SD_ILS/0/SD_ILS:2940282026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Falletta, Nicholas. Falletta, Nicholas. McGraw-Hill's SSAT/ISEE high school entrance exams.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-ssatisee-3rd-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Math level 1ent://SD_ILS/0/SD_ILS:2940292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Diehl, John. Joyce, Christine E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-3rd-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Biology E/Ment://SD_ILS/0/SD_ILS:2940302026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tarasen, Nick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-biology-em-3rd-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. United States historyent://SD_ILS/0/SD_ILS:2940312026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Farabaugh, David. Muntone, Stephanie. Teti, T. R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-3rd-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP microeconomics/macroeconomics questions to know by test dayent://SD_ILS/0/SD_ILS:2938242026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Reddington, Brian.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-mustknow-ap-microeconomicsmacroeconomics-questions">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP physics B & C questions to know by test dayent://SD_ILS/0/SD_ILS:2938302026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor De Richemond, Albert. Freudenrich, Craig C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-physics-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP U.S. government and politics questions to know by test dayent://SD_ILS/0/SD_ILS:2938312026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Madden, William.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-us-government-politics-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP environmental science questions to know by test dayent://SD_ILS/0/SD_ILS:2938332026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Womack, Chris. Gardner, Jane P. Richards, Stephanie.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-environmental-science-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's 500 MCAT general chemistry questions to know by test dayent://SD_ILS/0/SD_ILS:2940122026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Moore, John T., 1947- Langley, Richard.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-general-chemistry-questions-to-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mcgraw-Hill's 500 MCAT biology questions to know by test dayent://SD_ILS/0/SD_ILS:2940152026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Stewart, Robert.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-mcat-biology-questions-to-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>TABE level A test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940682026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Dutwin, Phyllis. Altreuter, Carol. Guglielmi, Kathy.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>TABE level D test of adult basic education : the first step to lifelong successent://SD_ILS/0/SD_ILS:2940752026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Dutwin, Phyllis. Ku, Richard T. (Richard Tse-Min)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-tabe-level-d-test-adult-basic-education-first-step-to-lifelong-success">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Math level 2ent://SD_ILS/0/SD_ILS:2940522026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Diehl, John. Joyce, Christine E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-2-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Math level 1ent://SD_ILS/0/SD_ILS:2940532026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Diehl, John. Joyce, Christine E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-math-level-1-2e">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. Biology E/Ment://SD_ILS/0/SD_ILS:2940542026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tarasen, Nick.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-biology-em-2e">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's SAT subject test. United States historyent://SD_ILS/0/SD_ILS:2940692026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Farabaugh, David. Muntone, Stephanie. Teti, T. R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-united-states-history-2e">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP English literature questions to know by test dayent://SD_ILS/0/SD_ILS:2938352026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Miller, Shveta Verma.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-literature-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP English language questions to know by test dayent://SD_ILS/0/SD_ILS:2938362026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Ambrose, Allyson.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-english-language-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP world history questions to know by test dayent://SD_ILS/0/SD_ILS:2938492026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Stevens, Adam.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-world-history-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP U.S. history questions to know by test dayent://SD_ILS/0/SD_ILS:2938502026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Demeter, Scott E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-us-history-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP psychology questions to know by test dayent://SD_ILS/0/SD_ILS:2938512026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Williams, Lauren.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-psychology-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>5 steps to a 5. 500 AP biology questions to know by test dayent://SD_ILS/0/SD_ILS:2938522026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lebitz, Mina.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/5-steps-to-500-ap-biology-questions-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>MACHINA SAPIENS how intelligent machines passed turing's test (and what happened the next day).ent://SD_ILS/0/SD_ILS:5698062026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Cristianini, Nello.<br/>Preferred Shelf Number Q325.5<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003582212">https://www.taylorfrancis.com/books/9781003582212</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to Aerospace Engineering with a Flight Test Perspectiveent://SD_ILS/0/SD_ILS:6003932026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Corda, Stephen.<br/>Preferred Shelf Number XX(600393.1)<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394309290">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394309290</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Frontiers of test validity theory : measurement, causation, and meaningent://SD_ILS/0/SD_ILS:5551502026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Markus, Keith A., author. Borsboom, Denny, author.<br/>Preferred Shelf Number BF39<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003398219">https://www.taylorfrancis.com/books/9781003398219</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Assessing neuromotor readiness for learning : the INPP developmental screening test and school intervention programmeent://SD_ILS/0/SD_ILS:5995452026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Goddard, Sally, 1957- author.<br/>Preferred Shelf Number LC4704 .G64 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394214693">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394214693</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Psychometrics, Test Theory, and the Latent Factors Model.ent://SD_ILS/0/SD_ILS:6003872026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Blahus, Pet. Blahus, Petr/Brown, Bruce L. Bunderson, C. Victor.<br/>Preferred Shelf Number XX(600387.1)<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119312246">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119312246</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A test of morals : surgical, ethical, and psychosocial considerations in human head transplantationent://SD_ILS/0/SD_ILS:5869782026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Furr, L. Allen, author.<br/>Preferred Shelf Number RD594.12<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003367017">https://www.taylorfrancis.com/books/9781003367017</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Dengue Diagnostics The Right Test at the Right Time for the Right Group.ent://SD_ILS/0/SD_ILS:5563622026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Sekaran, Shamala Devi.<br/>Preferred Shelf Number RA644 .D4<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032669564">https://www.taylorfrancis.com/books/9781032669564</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>State-society relations around the world through the lens of the COVID-19 pandemic : rapid-testent://SD_ILS/0/SD_ILS:5859532026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Duca, Federica, editor. Meny-Gibert, Sarah, editor.<br/>Preferred Shelf Number RA644 .C67<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003321545">https://www.taylorfrancis.com/books/9781003321545</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>British nuclear weapons and the test ban : squaring the circle of defence and arms control, 1974-82ent://SD_ILS/0/SD_ILS:5773322026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Walker, John R., 1960- author.<br/>Preferred Shelf Number U264.5 .G7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003375708">https://www.taylorfrancis.com/books/9781003375708</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Prenatal Diagnostic Testing for Genetic Disorders The revolution of the Non-Invasive Prenatal Testent://SD_ILS/0/SD_ILS:5218522026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Di Renzo, Gian Carlo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-31758-3">https://doi.org/10.1007/978-3-031-31758-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Testing of Materials for Fire Protection Needs European Standard Test Methods for the Building Sectorent://SD_ILS/0/SD_ILS:5275692026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Makovická Osvaldová, Linda. author. Fatriasari, Widya. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-39711-0">https://doi.org/10.1007/978-3-031-39711-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approachent://SD_ILS/0/SD_ILS:5202912026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Li, Xiaowei. author. Yan, Guihai. author. Liu, Cheng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-8551-5">https://doi.org/10.1007/978-981-19-8551-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software Testing Automation Testability Evaluation, Refactoring, Test Data Generation and Fault Localizationent://SD_ILS/0/SD_ILS:5203772026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Parsa, Saeed. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-22057-9">https://doi.org/10.1007/978-3-031-22057-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Educational accountability and American federalism : moving beyond a test-based approachent://SD_ILS/0/SD_ILS:5810632026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Portz, John, 1953- author.<br/>Preferred Shelf Number LB2806.22<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003276890">https://www.taylorfrancis.com/books/9781003276890</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>ACE THAT TEST a students guide to learning better.ent://SD_ILS/0/SD_ILS:5520982026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Sumeracki, Megan, author.<br/>Preferred Shelf Number LB1066<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003327530">https://www.taylorfrancis.com/books/9781003327530</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>SYSTEMATICALLY ANALYSING INDIRECT TRANSLATIONS putting the concatenation effect hypothesis to... the test.ent://SD_ILS/0/SD_ILS:5670642026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hadley, James (Researcher in literary translation), author.<br/>Preferred Shelf Number P306.97 .I53<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429282768">https://www.taylorfrancis.com/books/9780429282768</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CALIFORNIA'S RECALL ELECTION OF GAVIN NEWSOM covid-19 and the test of leadership.ent://SD_ILS/0/SD_ILS:5635372026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Gerston, Larry N. Currin-Percival, Mary. Percival, Garrick L.<br/>Preferred Shelf Number F866.4 .N498<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003217954">https://www.taylorfrancis.com/books/9781003217954</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pregnancy, delivery, childbirth : a gender and cultural history from antiquity to the test tube in Europeent://SD_ILS/0/SD_ILS:5641672026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Filippini, Nadia Maria, author. Boscolo, Clelia, translator.<br/>Preferred Shelf Number RG511 .F4513 2021<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429265457">https://www.taylorfrancis.com/books/9780429265457</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pluralism, poetry, and literacy : a test of reading and interpretive techniquesent://SD_ILS/0/SD_ILS:5709572026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kalck, Xavier, author.<br/>Preferred Shelf Number PN81 .K24 2021<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429200786">https://www.taylorfrancis.com/books/9780429200786</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>SIGNAL DETECTION FOR MEDICAL SCIENTISTS; LIKELIHOOD RATIO TEST-BASED METHODOLOGYent://SD_ILS/0/SD_ILS:5545052026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tiwari, Ram (Ram C.), author. Zalkikar, Jyoti, author. Huang, Lan (Statistician), author.<br/>Preferred Shelf Number RM301.27<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429259753">https://www.taylorfrancis.com/books/9780429259753</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Validity an integrated approach to test score meaning and useent://SD_ILS/0/SD_ILS:5825712026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Cizek, Gregory J.<br/>Preferred Shelf Number LB3060.7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429291661">https://www.taylorfrancis.com/books/9780429291661</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>PSYCHOMETRICS OF STANDARD SETTING connecting policy and test scores.ent://SD_ILS/0/SD_ILS:5844652026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Reckase, Mark.<br/>Preferred Shelf Number BF39<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429156410">https://www.taylorfrancis.com/books/9780429156410</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A democratic theory of educational credibility : from test-based assessment to interpersonal responsibilityent://SD_ILS/0/SD_ILS:5583472026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Gottlieb, Derek, author.<br/>Preferred Shelf Number LB2806.22 .G68 2020 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429019159">https://www.taylorfrancis.com/books/9780429019159</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The history of alternative test methods in toxicologyent://SD_ILS/0/SD_ILS:4603662026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Balls, Michael, 1938- editor. Combes, Robert, editor. Worth, Andrew P., editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="https://www.sciencedirect.com/science/book/9780128136973">https://www.sciencedirect.com/science/book/9780128136973</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:4844092026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Larner, A. J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-17562-7">https://doi.org/10.1007/978-3-030-17562-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniquesent://SD_ILS/0/SD_ILS:4848842026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design Automation Techniques for Approximation Circuits Verification, Synthesis and Testent://SD_ILS/0/SD_ILS:4864112026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papersent://SD_ILS/0/SD_ILS:4866872026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-32-9767-8">https://doi.org/10.1007/978-981-32-9767-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electromagnetic compatibility (EMC) design and test case analysisent://SD_ILS/0/SD_ILS:5951142026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Zheng, Junqi, 1975- author.<br/>Preferred Shelf Number TK7867.2 .Z44 2019 EB<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118956847">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118956847</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CompTIA PenTest+ Practice Test : Exam PT0-001ent://SD_ILS/0/SD_ILS:5953292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Panek, Crystal, author. Tracy, Robb.<br/>Preferred Shelf Number TK5105.59<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119575931">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119575931</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A Study Guide to the ISTQB® Foundation Level 2018 Syllabus Test Techniques and Sample Mock Examsent://SD_ILS/0/SD_ILS:3997732026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Roman, Adam. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-98740-8">https://doi.org/10.1007/978-3-319-98740-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Long-Life Design and Test Technology of Typical Aircraft Structuresent://SD_ILS/0/SD_ILS:4011842026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Liu, Jun. author. Yue, Zhufeng. author. Geng, Xiaoliang. author. Wen, Shifeng. author. Yan, Wuzhu. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-8399-0">https://doi.org/10.1007/978-981-10-8399-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test developmentent://SD_ILS/0/SD_ILS:5942292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Irwing, Paul, editor.<br/>Preferred Shelf Number BF39 .W55 2018<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118489772">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118489772</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Test and Launch Control Technology for Launch Vehiclesent://SD_ILS/0/SD_ILS:4007422026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Song, Zhengyu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-8712-7">https://doi.org/10.1007/978-981-10-8712-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Wiley handbook of psychometric testing : a multidisciplinary reference on survey, scale and test developmentent://SD_ILS/0/SD_ILS:4241732026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Irwing, Frederick Paul, editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1002/9781118489772">Wiley Online Library</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:5194582026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Larner, A.J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-16697-1">https://doi.org/10.1007/978-3-319-16697-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Simulation technologies in networking and communications : selecting the best tool for the testent://SD_ILS/0/SD_ILS:5386682026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Pathan, Al-Sakib Khan, editor. Monowar, Muhammad Mostafa, editor. Khan, Shafiullah, editor.<br/>Preferred Shelf Number QA76.9 .C65 S56 2015<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781482225501">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Critical mm-Wave Components for Synthetic Automatic Test Systemsent://SD_ILS/0/SD_ILS:5296442026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hrobak, Michael. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-658-09763-9">https://doi.org/10.1007/978-3-658-09763-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>RILEM Technical Committee 195-DTD Recommendation for Test Methods for AD and TD of Early Age Concrete Round Robin Documentation Report: Program, Test Results and Statistical Evaluationent://SD_ILS/0/SD_ILS:5297902026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bjøntegaard, Øyvind. author. Martius-Hammer, Tor Arne. author. Krauss, Matias. author. Budelmann, Harald. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-94-017-9266-0">https://doi.org/10.1007/978-94-017-9266-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Place and Health as Complex Systems A Case Study and Empirical Testent://SD_ILS/0/SD_ILS:5193872026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Castellani, Brian. author. Rajaram, Rajeev. author. Buckwalter, J. Galen. author. Ball, Michael. author. Hafferty, Frederic. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-09734-3">https://doi.org/10.1007/978-3-319-09734-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A campaign of quiet persuasion how the college board desegregated sat test centers in the deep south, 1960-1965ent://SD_ILS/0/SD_ILS:2416002026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bates, Jan Wheeler. Project Muse.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://muse.jhu.edu/books/9780807152720/">Full text available: </a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Evaluation of Aircraft Avionics and Weapon Systemsent://SD_ILS/0/SD_ILS:3649292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor McShea, Robert E.<br/>Preferred Shelf Number \(364929.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1049/SBRA507E">http://dx.doi.org/10.1049/SBRA507E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICsent://SD_ILS/0/SD_ILS:4874052026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Psychiatric mental health nursing success a course review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2805972026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Curtis, Cathy Melfi. Fegley, Audra Baker. Tuzo, Carol Norton.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=532511</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Instant penetration testing setting up a test lab how-to : set up your own penetration testing lab using practical and precise recipesent://SD_ILS/0/SD_ILS:3130442026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Fadyushin, Vyacheslav.<br/>Preferred Shelf Number ONLINE(313044.1)<br/>Electronic Access Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3">http://app.knovel.com/web/toc.v/cid:kpIPTSUTL3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Three Approaches to Data Analysis Test Theory, Rough Sets and Logical Analysis of Dataent://SD_ILS/0/SD_ILS:3331952026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Chikalov, Igor. author. Lozin, Vadim. author. Lozina, Irina. author. Moshkov, Mikhail. author. Nguyen, Hung Son. author.<br/>Preferred Shelf Number ONLINE(333195.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-28667-4">http://dx.doi.org/10.1007/978-3-642-28667-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design Characteristics of Virtual Learning Environments A Theoretical Integration and Empirical Test of Technology Acceptance and IS Success Researchent://SD_ILS/0/SD_ILS:3352402026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Müller, Daniel. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335240.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-658-00392-0">http://dx.doi.org/10.1007/978-3-658-00392-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Families of the missing a test for contemporary approaches to transitional justiceent://SD_ILS/0/SD_ILS:3445352026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Robins, Simon.<br/>Preferred Shelf Number ONLINE(344535.1)<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9780203517079">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Choosing the Correct Radiologic Test Case-Based Teaching Filesent://SD_ILS/0/SD_ILS:3330662026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lee, Susanna I. author. Thrall, James H. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333066.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15772-1">http://dx.doi.org/10.1007/978-3-642-15772-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>China Satellite Navigation Conference (CSNC) 2013 Proceedings BeiDou/GNSS Navigation Applications • Test & Assessment Technology • User Terminal Technologyent://SD_ILS/0/SD_ILS:3344202026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Sun, Jiadong. editor. Jiao, Wenhai. editor. Wu, Haitao. editor. Shi, Chuang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334420.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37398-5">http://dx.doi.org/10.1007/978-3-642-37398-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papersent://SD_ILS/0/SD_ILS:3351562026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.<br/>Preferred Shelf Number ONLINE(335156.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design, Analysis and Test of Logic Circuits Under Uncertaintyent://SD_ILS/0/SD_ILS:3356692026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335669.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-9644-9">http://dx.doi.org/10.1007/978-90-481-9644-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmenent://SD_ILS/0/SD_ILS:3383092026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kleuker, Stephan. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(338309.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-8348-2068-6">http://dx.doi.org/10.1007/978-3-8348-2068-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Non-parametric Tuning of PID Controllers A Modified Relay-Feedback-Test Approachent://SD_ILS/0/SD_ILS:3309862026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Boiko, Igor. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(330986.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-4465-6">http://dx.doi.org/10.1007/978-1-4471-4465-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System-Level Validation High-Level Modeling and Directed Test Generation Techniquesent://SD_ILS/0/SD_ILS:3312652026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331265.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedingsent://SD_ILS/0/SD_ILS:1970902026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Rahaman, Hafizur. editor. Chattopadhyay, Sanatan. editor. Chattopadhyay, Santanu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-31494-0">http://dx.doi.org/10.1007/978-3-642-31494-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Industrial Process Identification and Control Design Step-test and Relay-experiment-based Methodsent://SD_ILS/0/SD_ILS:1686472026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Liu, Tao. author. Gao, Furong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-977-2">http://dx.doi.org/10.1007/978-0-85729-977-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Built-in-Self-Test and Digital Self-Calibration for RF SoCsent://SD_ILS/0/SD_ILS:1732422026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bou-Sleiman, Sleiman. author. Ismail, Mohammed. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-9548-3">http://dx.doi.org/10.1007/978-1-4419-9548-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals success a Q & A review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2803162026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Nugent, Patricia Mary, 1944- Vitale, Barbara Ann, 1944-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495469</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Assessing neuromotor readiness for learning the INPP developmental screening test and school intervention programmeent://SD_ILS/0/SD_ILS:3054912026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Goddard, Sally, 1957- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781119945017">An electronic book accessible through the World Wide Web; click for information</a>
Cover image <a href="http://catalogimages.wiley.com/images/db/jimages/9781119970682.jpg">http://catalogimages.wiley.com/images/db/jimages/9781119970682.jpg</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High Quality Test Pattern Generation and Boolean Satisfiabilityent://SD_ILS/0/SD_ILS:1733602026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-9976-4">http://dx.doi.org/10.1007/978-1-4419-9976-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Refinement of Econometric Estimation and Test Procedures Finite Sample and Asymptotic Analysisent://SD_ILS/0/SD_ILS:2370032026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Phillips, Garry D. A.. Tzavalis, Elias.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511493157">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Is There a Court for Gaza? A Test Bench for International Justiceent://SD_ILS/0/SD_ILS:2056722026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Meloni, Chantal. editor. Tognoni, Gianni. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-6704-820-0">http://dx.doi.org/10.1007/978-90-6704-820-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Secure and resilient software : requirements, test cases, and testing methodsent://SD_ILS/0/SD_ILS:5401562026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Merkow, Mark S., author. Raghavan, Lakshmikanth.<br/>Preferred Shelf Number QA76.76 .T48 M47 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439866221">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Med-surg success a Q&A review applying critical thinking to test takingent://SD_ILS/0/SD_ILS:2803132026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Colgrove, Kathryn Cadenhead. Hargrove-Huttel, Ray A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495462">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495462</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test success test-taking techniques for beginning nursing studentsent://SD_ILS/0/SD_ILS:2803172026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Nugent, Patricia Mary, 1944- Vitale, Barbara Ann, 1944-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495470">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=495470</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digital System Test and Testable Design Using HDL Models and Architecturesent://SD_ILS/0/SD_ILS:1729072026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Navabi, Zainalabedin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7548-5">http://dx.doi.org/10.1007/978-1-4419-7548-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerating Test, Validation and Debug of High Speed Serial Interfacesent://SD_ILS/0/SD_ILS:2054842026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-9398-1">http://dx.doi.org/10.1007/978-90-481-9398-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Detect and Deter: Can Countries Verify the Nuclear Test Ban?ent://SD_ILS/0/SD_ILS:2061392026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Dahlman, Ola. author. Mackby, Jenifer. author. Mykkeltveit, Svein. author. Haak, Hein. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-1676-6">http://dx.doi.org/10.1007/978-94-007-1676-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Passing the test combat in Korea, April-June 1951ent://SD_ILS/0/SD_ILS:2442242026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Greenwood, John T. Bowers, William T., 1946- Project Muse.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://muse.jhu.edu/books/9780813134536/">Full text available: </a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical models for test equating, scaling, and linkingent://SD_ILS/0/SD_ILS:1446462026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Davier, Alina A. von.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=372637">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=372637</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Streamline numerical well test interpretation theory and methodent://SD_ILS/0/SD_ILS:1485172026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Jun, Yao. Wu, Minglu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123860279">http://www.sciencedirect.com/science/book/9780123860279</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibrationent://SD_ILS/0/SD_ILS:2055722026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test-Driven Development An Empirical Evaluation of Agile Practiceent://SD_ILS/0/SD_ILS:1908992026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Madeyski, Lech. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-04288-1">http://dx.doi.org/10.1007/978-3-642-04288-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Evaluation of Aircraft Avionics and Weapons Systemsent://SD_ILS/0/SD_ILS:2480512026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor McShea, Robert E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/SBRA033E">http://dx.doi.org/10.1049/SBRA033E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design and test technology for dependable systems-on-chipent://SD_ILS/0/SD_ILS:2780432026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Ubar, Raimund, 1941- Raik, Jaan, 1972- Vierhaus, Heinrich Theodor, 1951-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=329154">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=329154</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Allgemeinbildung in Deutschland Erkenntnisse aus dem SPIEGEL-Studentenpisa-Testent://SD_ILS/0/SD_ILS:1797132026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Verbeet, Markus. editor. Trepte, Sabine. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-531-92543-1">http://dx.doi.org/10.1007/978-3-531-92543-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test ride on the Sunnyland bus a daughter's civil rights journeyent://SD_ILS/0/SD_ILS:2463942026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Spagna, Ana Maria. Project Muse.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://muse.jhu.edu/books/9780803233928/">Full text available: </a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Testent://SD_ILS/0/SD_ILS:1663332026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Liu, Ai-Qun. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-46262-2">http://dx.doi.org/10.1007/978-0-387-46262-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Power-Aware Testing and Test Strategies for Low Power Devicesent://SD_ILS/0/SD_ILS:1721002026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Girard, Patrick. editor. Nicolici, Nicola. editor. Wen, Xiaoqing. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-0928-2">http://dx.doi.org/10.1007/978-1-4419-0928-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologiesent://SD_ILS/0/SD_ILS:1721032026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bosio, Alberto. author. Dilillo, Luigi. author. Girard, Patrick. author. Pravossoudovitch, Serge. author. Virazel, Arnaud. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-0938-1">http://dx.doi.org/10.1007/978-1-4419-0938-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Efficient Test Methodologies for High-Speed Serial Linksent://SD_ILS/0/SD_ILS:2050842026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hong, Dongwoo. author. Cheng, Kwang-Ting. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-3443-4">http://dx.doi.org/10.1007/978-90-481-3443-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Intangible Impairment Qualitativer Impairment-Test für immaterielle Vermögenswerteent://SD_ILS/0/SD_ILS:2015462026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Wöhrmann, Arnt. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-8349-8448-7">http://dx.doi.org/10.1007/978-3-8349-8448-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ecotoxicological Characterization of Waste Results and Experiences of an International Ring Testent://SD_ILS/0/SD_ILS:1679162026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Römbke, Jörg. editor. Moser, Heidrun. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-88959-7">http://dx.doi.org/10.1007/978-0-387-88959-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Principles of CNS drug development from test tube to patientent://SD_ILS/0/SD_ILS:2981602026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kelly, John, 1961-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9780470682920">http://dx.doi.org/10.1002/9780470682920</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A sound engineer's guide to audio test and measurementent://SD_ILS/0/SD_ILS:1485612026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Ballou, Glen.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780240812656">http://www.sciencedirect.com/science/book/9780240812656</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Parsing the Turing Test Philosophical and Methodological Issues in the Quest for the Thinking Computerent://SD_ILS/0/SD_ILS:1699082026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Epstein, Robert. editor. Roberts, Gary. editor. Beber, Grace. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6710-5">http://dx.doi.org/10.1007/978-1-4020-6710-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nuclear Test Ban Converting Political Visions to Realityent://SD_ILS/0/SD_ILS:1699802026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Haak, Hein. author. Mykkeltveit, S. author. Dahlman, Ola. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6885-0">http://dx.doi.org/10.1007/978-1-4020-6885-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CliffsNotes Praxis II elementary education (0011, 0012, 0014) test prepent://SD_ILS/0/SD_ILS:3031352026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Paris, Jocelyn L., 1977- Paris, Judy L., 1950-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.contentreserve.com/TitleInfo.asp?ID={D543705F-1C10-4261-A363-4F008A8C0222}&Format=50">Click for information</a>
Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118266571">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Diagnosis of Analogue, Mixed-Signal and RF Integrated Circuits The system on chip approachent://SD_ILS/0/SD_ILS:2477572026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Yichuang Sun, ed.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBCS019E">http://dx.doi.org/10.1049/PBCS019E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Dateent://SD_ILS/0/SD_ILS:1698262026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6488-3">http://dx.doi.org/10.1007/978-1-4020-6488-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies Process-Aware SRAM Design and Testent://SD_ILS/0/SD_ILS:1701352026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Pavlov, Andrei. author. Sachdev, Manoj. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8363-1">http://dx.doi.org/10.1007/978-1-4020-8363-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System-on-chip test architectures nanometer design for testabilityent://SD_ILS/0/SD_ILS:1485572026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Wang, Laung-Terng. Stroud, Charles E. Touba, Nur A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123739735">http://www.sciencedirect.com/science/book/9780123739735</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Testing Network An Integral Approach to Test Activities in Large Software Projectsent://SD_ILS/0/SD_ILS:1881542026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Henry, Pierre. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-78504-0">http://dx.doi.org/10.1007/978-3-540-78504-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLEent://SD_ILS/0/SD_ILS:1769332026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Weinmann, Alexander. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-211-37139-8">http://dx.doi.org/10.1007/978-3-211-37139-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design of Systems on a Chip: Design and Testent://SD_ILS/0/SD_ILS:1658572026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32500-X">http://dx.doi.org/10.1007/0-387-32500-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Interpreting standardized test scores strategies for data-driven instructional decision makingent://SD_ILS/0/SD_ILS:3685952026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Mertler, Craig A.<br/>Preferred Shelf Number ONLINE(368595.1)<br/>Electronic Access SAGE knowledge <a href="http://sk.sagepub.com/books/interpreting-standardized-test-scores">http://sk.sagepub.com/books/interpreting-standardized-test-scores</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI test principles and architectures design for testabilityent://SD_ILS/0/SD_ILS:2537792026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Theory of preliminary test and Stein-type estimation with applicationsent://SD_ILS/0/SD_ILS:3030512026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Saleh, A. K. Md. Ehsanes. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471773751">http://dx.doi.org/10.1002/0471773751</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Goodwillbilanzierung und Informationsvermittlung nach internationalen Rechnungslegungsstandards Business Combinations (IFRS, US-GAAP), Kaufpreisallokation, Impairment Test, Konvergenzbestrebungenent://SD_ILS/0/SD_ILS:2032942026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lopatta, Kerstin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-8350-9211-2">http://dx.doi.org/10.1007/978-3-8350-9211-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™ent://SD_ILS/0/SD_ILS:1660492026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>.NET Test Automation Recipes A Problem-Solution Approachent://SD_ILS/0/SD_ILS:1708682026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor McCaffrey, James D. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4302-0163-2">http://dx.doi.org/10.1007/978-1-4302-0163-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Make and Test Projects in Engineering Design Creativity, Engagement and Learningent://SD_ILS/0/SD_ILS:1753612026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Samuel, Andrew Emery. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-285-3">http://dx.doi.org/10.1007/1-84628-285-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Inference for Change Point and Post Change Means After a CUSUM Testent://SD_ILS/0/SD_ILS:1652512026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Wu, Yanhong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b100107">http://dx.doi.org/10.1007/b100107</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Neuroeconomia, Neuromarketing e Processi Decisionali Le evidenze di un test di memorizzazione condotto per la prima volta in Italiaent://SD_ILS/0/SD_ILS:1744572026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Babiloni, Fabio. author. Meroni, Vittorio Marco. author. Soranzo, Ramon. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-56898-646-7">http://dx.doi.org/10.1007/1-56898-646-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to Advanced System-on-Chip Test Design and Optimizationent://SD_ILS/0/SD_ILS:1651622026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Larsson, Erik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Small-scale Freshwater Toxicity Investigations Toxicity Test Methodsent://SD_ILS/0/SD_ILS:1688142026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Blaise, Christian. editor. Férard, Jean-François. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3120-3">http://dx.doi.org/10.1007/1-4020-3120-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>System-level Test and Validation of Hardware/Software Systemsent://SD_ILS/0/SD_ILS:1752722026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design and development of medical electronic instrumentation a practical perspective of the design, construction, and test of medical devicesent://SD_ILS/0/SD_ILS:3188412026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Prutchi, David. Norris, Michael.<br/>Preferred Shelf Number ONLINE(318841.1)<br/>Electronic Access <a href="http://www.contentreserve.com/TitleInfo.asp?ID={0BB5C1F5-EFCF-4766-BDBA-63A640B37565}&Format=50">Click for information</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=44333">http://www.books24x7.com/marc.asp?bookid=44333</a>
Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=225809">http://public.eblib.com/choice/publicfullrecord.aspx?p=225809</a>
ebrary <a href="http://site.ebrary.com/id/10114115">http://site.ebrary.com/id/10114115</a>
EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=127327">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=127327</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Turing test verbal behavior as the hallmark of intelligenceent://SD_ILS/0/SD_ILS:2201952026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Shieber, Stuart M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267336">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267336</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design and development of medical electronic instrumentation a practical perspective of the design, construction, and test of medical devicesent://SD_ILS/0/SD_ILS:3016292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Prutchi, David. Norris, Michael. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0471681849">http://dx.doi.org/10.1002/0471681849</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test better, teach better the instructional role of assessmentent://SD_ILS/0/SD_ILS:1441702026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Popham, W. James.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=102059">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=102059</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Well test analysis the use of advanced interpretation modelsent://SD_ILS/0/SD_ILS:2554492026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bourdet, Dominique.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444509680">http://www.sciencedirect.com/science/book/9780444509680</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Using test data in clinical practice a handbook for mental health professionalsent://SD_ILS/0/SD_ILS:3698972026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor MacCluskie, Kathryn C. Welfel, Elizabeth Reynolds, 1949- Toman, Sarah M.<br/>Preferred Shelf Number ONLINE(369897.1)<br/>Electronic Access SAGE knowledge <a href="http://sk.sagepub.com/books/using-test-data-in-clinical-practice">http://sk.sagepub.com/books/using-test-data-in-clinical-practice</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The total CISSP exam prep book : practice questions, answers, and test taking tips and techniquesent://SD_ILS/0/SD_ILS:5389642026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Peltier, Thomas R., author. Howard, Patrick D.<br/>Preferred Shelf Number TK5105.59 .P454 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420031447">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Cell culture models of biological barriers : in vitro test systems for drug absorption and deliveryent://SD_ILS/0/SD_ILS:5463222026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lehr, Claus-Michael, 1961-<br/>Preferred Shelf Number RM301.25 .C454 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781134473458">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Practical radio frequency test and measurement a technician's handbookent://SD_ILS/0/SD_ILS:2546922026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Carr, Joseph J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750671613">http://www.sciencedirect.com/science/book/9780750671613</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>PDCA/Test : a quality tool framework for software testingent://SD_ILS/0/SD_ILS:5439272026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lewis, William E.<br/>Preferred Shelf Number QA76.76 .T48 L49 1999<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429131769">https://www.taylorfrancis.com/books/9780429131769</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Accelerated testing statistical models, test plans and data analysesent://SD_ILS/0/SD_ILS:2952592026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Nelson, Wayne, 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a>
Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a>
HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Assessment of immune status by the leukocyte adherence inhibition testent://SD_ILS/0/SD_ILS:2502152026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Thomson, D. M. P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780126897500">http://www.sciencedirect.com/science/book/9780126897500</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The science of sound recordingent://SD_ILS/0/SD_ILS:2671032026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kadis, Jay. Brown, Pat, 1957- Test and measurement.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9780240823645">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CE marking handbook a practical approach to global safety certificationent://SD_ILS/0/SD_ILS:2543652026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lohbeck, David, 1950-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780750698191">http://www.sciencedirect.com/science/book/9780750698191</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mcgraw-Hill's DATent://SD_ILS/0/SD_ILS:2940062026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Evangelist, Thomas A. Hanks, Wendy.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-dat-cdrom">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's MCATent://SD_ILS/0/SD_ILS:2940562026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hademenos, George J. McCloskey, Candice J. Murphree, Shaun. Warner, Jennifer M. Zahler, Kathy A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-mcat-cdrom-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's GMATent://SD_ILS/0/SD_ILS:2940422026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hasik, James. Rudnick, Stacey. Hackney, Ryan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-gmat-2011-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's CBESTent://SD_ILS/0/SD_ILS:2940442026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor McGraw-Hill Companies.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-cbest">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid Q&A for the NBDE part IIent://SD_ILS/0/SD_ILS:2937222026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Portnof, Jason E. Leung, Timothy. Yeoh, Melvyn S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mcgrawhill.pdn.ipublishcentral.com/reader/first-aid-qampa-for-nbde-part-ii">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the wardsent://SD_ILS/0/SD_ILS:2937232026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Le, Tao. Bhushan, Vikas. Skapik, Julia.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mcgrawhill.pdn.ipublishcentral.com/reader/first-aid-for-wards-fifth-edition54577">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the Emergency Medicine Oral Boardsent://SD_ILS/0/SD_ILS:2937212026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Howes, David S. Gupta, Rohit. Waples-Trefil, Flora J. Pillow, M. Tyson. Tupesis, Janis P.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mcgrawhill.pdn.ipublishcentral.com/reader/first-aid-for-emergency-medicine-oral-boards54521">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the basic sciences. General principlesent://SD_ILS/0/SD_ILS:2936992026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Le, Tao. Krause, Kendall. Takiar, Vinita.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-basic-sciences-general-principles-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's 500 linear algebra questions ace your college examsent://SD_ILS/0/SD_ILS:2940072026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lipschutz, Seymour.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-college-linear-algebra-questions-to-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's 10 SAT math level 2 practice testsent://SD_ILS/0/SD_ILS:2940272026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Caputo, Christine.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-10-math-level-2-practice-tests">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the family medicine boardsent://SD_ILS/0/SD_ILS:2936962026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Le, Tao. Mendoza, Michael D. Coffa, Diana.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-family-medicine-boards-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the emergency medicine boardsent://SD_ILS/0/SD_ILS:2936972026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Blok, Barbara K. Cheung, Dickson S. Platts-Mills, Timothy Fortescue.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-emergency-medicine-boards-2e">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the basic sciences. Organ systemsent://SD_ILS/0/SD_ILS:2936982026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Le, Tao. Krause, Kendall. Halvorson, Elizabeth Eby. Hwang, William L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-basic-sciences-organ-systems-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mcgraw-Hill's 500 calculus questions ace your college examsent://SD_ILS/0/SD_ILS:2940142026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Mendelson, Elliott.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-500-college-calculus-questions-to-know-by-test-day">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the internal medicine boardsent://SD_ILS/0/SD_ILS:2937002026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Le, Tao. Chin-Hong, Peter. Baudendistel, Thomas E. Lai, Cindy J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-internal-medicine-boards-3rd-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the emergency medicine clerkshipent://SD_ILS/0/SD_ILS:2937022026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Stead, Latha G. Kaufman, Matthew S. Laack, Torrey A. Fisher, Jonathan. Jain, Anunaya.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-emergency-medicine-clerkship-third-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the obstetrics & gynecology clerkshipent://SD_ILS/0/SD_ILS:2937042026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kaufman, Matthew S. Holmes, Jean�e Simmons. Schachel, Priti P. Stead, Latha G.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-obstetrics-gynecology-clerkship-third-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the orthopaedic boardsent://SD_ILS/0/SD_ILS:2937052026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Malinzak, Robert A. Albritton, Mark J. (Mark James) Pickering, Trevor R.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-orthopaedic-boards-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's PCATent://SD_ILS/0/SD_ILS:2940572026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hademenos, George J. Murphree, Shaun. Warner, Jennifer M. Zahler, Kathy A. Whitener, Mark A.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-pcat">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Tests of adult basic education level A mathematics workbookent://SD_ILS/0/SD_ILS:2940602026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Ku, Richard T. (Richard Tse-Min)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/tabe-test-adult-basic-education-level-math-workbook-first-step-to-lifelong-success">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the surgery clerkshipent://SD_ILS/0/SD_ILS:2937132026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Stead, Latha G. Stead, S. Matthew. Kaufman, Matthew S. Mishra, Nitin.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-surgery-clerkship">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the emergency medicine boardsent://SD_ILS/0/SD_ILS:2937142026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Blok, Barbara K. Cheung, Dickson S. Platts-Mills, Timothy Fortescue.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-emergency-medicine-boards">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid radiology for the wardsent://SD_ILS/0/SD_ILS:2937152026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Stead, Latha G.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-radiology-for-wards">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the COMLEX an osteopathic manipulative medicine reviewent://SD_ILS/0/SD_ILS:2937182026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Nye, Zachary. Huxley, Stephen M.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-comlex-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the NBDE. Part IIent://SD_ILS/0/SD_ILS:2937192026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Portnof, Jason E. Leung, Timothy. Le, Tao.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-nbde-part-ii">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid Q&A for the NBDE part Ient://SD_ILS/0/SD_ILS:2937202026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Steinbacher, Derek M. (Derek Matthew) Sierakowski, Steven R. (Steven Robert)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-qa-for-nbde-part-i">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>McGraw-Hill's new GREent://SD_ILS/0/SD_ILS:2940402026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Dulan, Steven W. Advantage Education (Firm)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-new-gre-20112012-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>An introduction to TTCN-3ent://SD_ILS/0/SD_ILS:2987922026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Willcock, Colin.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470977903">An electronic book accessible through the World Wide Web; click for information</a>
<a href="http://proquest.safaribooksonline.com/?fpi=9780470977897">Available by subscription from Safari Books Online</a>
Books24x7 <a href="http://www.books24x7.com/marc.asp?bookid=41769">http://www.books24x7.com/marc.asp?bookid=41769</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=675190">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=675190</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10510619">http://site.ebrary.com/lib/alltitles/Doc?id=10510619</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the psychiatry clerkshipent://SD_ILS/0/SD_ILS:2937012026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Stead, Latha G. Kaufman, Matthew S. Yanofski, Jason, 1980-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-psychiatry-clerkship-third-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the pediatrics clerkshipent://SD_ILS/0/SD_ILS:2937032026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Stead, Latha G. Kaufman, Matthew S. Wasseem, Muhammad.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-pediatrics-clerkship-third-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the wardsent://SD_ILS/0/SD_ILS:2937062026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Le, Tao. Bhushan, Vikas. Skapik, Julia.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-wards-fourth-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the NBDE. Part Ient://SD_ILS/0/SD_ILS:2937072026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Steinbacher, Derek M. (Derek Matthew) Sierakowski, Steven R. (Steven Robert) American Dental Association. Joint Commission on National Dental Examinations.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-nbde-part-1-2e">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the anesthesiology boardsent://SD_ILS/0/SD_ILS:2937082026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bhatt, Himani. Powell, Karlyn J. Jean, Dominique Aimee.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-anesthesiology-boards">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the psychiatry boardsent://SD_ILS/0/SD_ILS:2937092026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Azzam, Amin. Yanofski, Jason, 1980- Kaftarian, Edward. Le, Tao. American Board of Psychiatry and Neurology.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-psychiatry-boards">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the neurology boardsent://SD_ILS/0/SD_ILS:2937102026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Rafii, Michael S. Cochrane, Thomas I. Le, Tao. American Board of Psychiatry and Neurology.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-neurology-boards">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the ABSITEent://SD_ILS/0/SD_ILS:2937112026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor LaFemina, Jennifer. Lancaster, Robert Todd. Le, Tao.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-absite">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the matchent://SD_ILS/0/SD_ILS:2937122026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Le, Tao. Chin-Hong, Peter. Baudendistel, Thomas E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-match-fifth-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the medicine clerkshipent://SD_ILS/0/SD_ILS:2937162026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kaufman, Matthew S. Stead, Latha G. Rusovici, Arthur.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-medicine-clerkship-third-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>First aid for the pediatric boardsent://SD_ILS/0/SD_ILS:2937172026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Le, Tao.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/first-aid-for-pediatric-boards-second-edition">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>REDESIGNING JUSTICE FOR PLURAL SOCIETIES case studies of minority accommodation from around the globeent://SD_ILS/0/SD_ILS:5587472026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor (Re)designing Justice for Plural Societies: Accommodative Practices Put to the Test (Conference) (2017 : Max Planck Institut für ethnologische Forschung) Alidadi, Katayoun, editor. Foblets, Marie-Claire, 1959- editor. Müller, Dominik M., editor. Max-Planck-Institut für ethnologische Forschung, sponsoring body.<br/>Preferred Shelf Number K3242 .A6<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003224174">https://www.taylorfrancis.com/books/9781003224174</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The lieutenant nun : annotated translation of the play, historical accounts and documents about Antonio/Catalina de Erausoent://SD_ILS/0/SD_ILS:5646252026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Albalá Pelegrín, Marta, editor. Test, Edward McLean, editor. Velasco, Sherry M. (Sherry Marie), 1962- writer of foreword. Chess, Simone, 1980- writer of afterword. Kemp, Sawyer K., writer of afterword.<br/>Preferred Shelf Number CT1358 .E7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003291732">https://www.taylorfrancis.com/books/9781003291732</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Information security management handbookent://SD_ILS/0/SD_ILS:5428312026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tipton, Harold F. Krause, Micki.<br/>Preferred Shelf Number QA76.9 .A25 I54165 2003<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420003406">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Applied time series analysis for the social sciences : specification, estimation, and inferenceent://SD_ILS/0/SD_ILS:5971702026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Baker, Regina M., author.<br/>Preferred Shelf Number HA30.3 .B35 2026<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119010494">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119010494</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Becoming quantum safe protect your business and mitigate risks with post-quantum cryptography and crypto-agilityent://SD_ILS/0/SD_ILS:6001792026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Arun, Jai Singh, author. Harishankar, Ray, author. Rjaibi, Walid, author. Diffie, Whitfield, writer of foreword.<br/>Preferred Shelf Number QA76.889<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394406784">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394406784</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Wiley handbook of art therapyent://SD_ILS/0/SD_ILS:6002642026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Gussak, David, editor. Rosal, Marcia L., editor.<br/>Preferred Shelf Number RC489 .A7 W55 2026<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394215027">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394215027</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Neuropsychology in the Age of Digital Health Exploration, Application, and Practical Implementation.ent://SD_ILS/0/SD_ILS:6003212026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Singh, Shifali. Weisenbach, Sara L.<br/>Preferred Shelf Number XX(600321.1)<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394295432">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394295432</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Renewable Energy Transition with Artificial Intelligence Challenge-Driven Solutions.ent://SD_ILS/0/SD_ILS:6004292026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Dethlefs, Nina. Chatterjee, Joyjit.<br/>Preferred Shelf Number XX(600429.1)<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394300068">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394300068</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>ACADEMIC WRITING AND REFERENCING FOR YOUR POLICING DEGREEent://SD_ILS/0/SD_ILS:5785882026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bottomley, Jane (Senior language tutor), author. Pryjmachuk, Steven, 1964- author. Wright, Martin (Writer on policing), author.<br/>Preferred Shelf Number RT24<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781041054054">https://www.taylorfrancis.com/books/9781041054054</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Critical thinking skills for your policing degreeent://SD_ILS/0/SD_ILS:5737602026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bottomley, Jane (Senior language tutor), author. Pryjmachuk, Steven, 1964- author. Wright, Martin (Writer on policing), author.<br/>Preferred Shelf Number HV8195 .A4<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781041054887">https://www.taylorfrancis.com/books/9781041054887</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>UNDERSTANDING AND HELPING TO OVERCOME EXAM ANXIETY what is it, why is it important and where... does it come from?.ent://SD_ILS/0/SD_ILS:5563772026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Putwain, David.<br/>Preferred Shelf Number LB3060.6<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781032716411">https://www.taylorfrancis.com/books/9781032716411</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>English language mediated settings and educational inequalities : language education policy agendas in the South Pacificent://SD_ILS/0/SD_ILS:5590962026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Goundar, Prashneel R., author.<br/>Preferred Shelf Number PE1068 .O3<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003479147">https://www.taylorfrancis.com/books/9781003479147</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>MULTILINGUAL LEADERSHIP IN TESOLent://SD_ILS/0/SD_ILS:5570482026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tính Trịnh, Ethan. De Oliveira, Luciana C. Selvi, Ali Fuad.<br/>Preferred Shelf Number PE1128 .A2<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003396079">https://www.taylorfrancis.com/books/9781003396079</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>MIMO antenna systems for 5G and beyondent://SD_ILS/0/SD_ILS:5991462026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Chen, Xiaoming, (Professor of information science and electronics), author. Soh, Ping Jack, author. Sharawi, Mohammad S., author.<br/>Preferred Shelf Number TK7871.6 .C455 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119932543">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119932543</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>GaN power devices for efficient power conversionent://SD_ILS/0/SD_ILS:5993732026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Lidow, Alex, author.<br/>Preferred Shelf Number TK7871.95 .L53 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286980</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Signal processing : an applied decomposition approachent://SD_ILS/0/SD_ILS:5994652026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Candy, James V., author. John Wiley & Sons, publisher.<br/>Preferred Shelf Number TK5102.9<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394207473">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394207473</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The false discovery rate : its meaning, interpretation and application in data scienceent://SD_ILS/0/SD_ILS:5994732026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Galwey, Nick, author. John Wiley & Sons, publisher.<br/>Preferred Shelf Number QA277 .G25 2025 EB<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119889809">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119889809</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Water resources management in mountain regionsent://SD_ILS/0/SD_ILS:5994312026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Singh, Virendra Bahadur, editor. Gupta, Rajesh Kumar (Of Ram Lal Anand College), editor. Diwan, Prerna, editor. Kumar, Amit (Geologist), editor.<br/>Preferred Shelf Number TC405 .W355 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394249619">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394249619</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Digitally curious : your guide to navigating the future of AI and all things techent://SD_ILS/0/SD_ILS:5994572026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Grill, Andrew (Futurist), author.<br/>Preferred Shelf Number HD45 .G695 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394309399">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394309399</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Wireless identification and sensing systems for harsh and severe environmentsent://SD_ILS/0/SD_ILS:5996562026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tedjini, Smaïl, editor. Palazzi, Valentina, editor.<br/>Preferred Shelf Number TK7872 .D48 W57 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394169108">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394169108</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nanotechnology-assisted recycling of textile waste : sustainable tools for textilesent://SD_ILS/0/SD_ILS:5997972026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Sharma, Prashansa, editor. Sahay, Shilpi Shree, editor<br/>Preferred Shelf Number TS1449 .N36 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394175017">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394175017</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Method validation in pharmaceutical analysis : a guide to best practiceent://SD_ILS/0/SD_ILS:5997982026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Ermer, Joachim, editor. Nethercote, Phil, editor.<br/>Preferred Shelf Number RS187<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831708">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527831708</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pharmaceutical microbiology : best practices, validation, quality assuranceent://SD_ILS/0/SD_ILS:5997992026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Rieth, Michael, 1963- author.<br/>Preferred Shelf Number QR46.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527848713">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527848713</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Supercritical adsorption for cleaner energy and the environmentent://SD_ILS/0/SD_ILS:5998002026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Zhou, Li, author<br/>Preferred Shelf Number QD547<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527851676">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527851676</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cyber-physical systems for innovating and transforming society 5.0ent://SD_ILS/0/SD_ILS:5998072026-02-22T09:24:37Z2026-02-22T09:24:37ZPreferred Shelf Number T14.5 .C93 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394197750">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394197750</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Resilient community microgridsent://SD_ILS/0/SD_ILS:5998422026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Swathika, O. V. Gnana, editor. Karthikeyan, K., editor.<br/>Preferred Shelf Number TK3106 .R47 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394272549">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394272549</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Deep learning on embedded systems : a hands-on approach using Jetson Nano and Raspberry Pient://SD_ILS/0/SD_ILS:5998802026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Arif, Tariq M., author. John Wiley & Sons, publisher.<br/>Preferred Shelf Number Q325.73 .A75 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394269297</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Progress in adhesion and adhesives. Volume 9ent://SD_ILS/0/SD_ILS:5999152026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Mittal, K. L., 1945- editor.<br/>Preferred Shelf Number TP968 .P76 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394315086">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394315086</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>UX for AI : a framework for designing AI-driven productsent://SD_ILS/0/SD_ILS:5999332026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Nudelman, Greg, author. Kempka, Daria, editor.<br/>Preferred Shelf Number QA76.9 .H85 N83 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394352272">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394352272</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CISA certified information systems auditor practice tests : covers 2024-2025 exam objectivesent://SD_ILS/0/SD_ILS:5999552026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Grego, Peter H., author. Chapple, Mike, author.<br/>Preferred Shelf Number QA76.3 .G74 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394324460">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394324460</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Anatomy and physiology of domestic animalsent://SD_ILS/0/SD_ILS:5999562026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Akers, R. Michael, author. Denbow, D. Michael, author.<br/>Preferred Shelf Number SF761 .A54 2025 EB<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394304288">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394304288</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Physical Ability Testing : A Guide to Safe Job Placement, Accommodation, and Legal Compliance.ent://SD_ILS/0/SD_ILS:6002532026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bunch, Richard W. Bardarson, Trevor D. Swift, Douglas A. Thompson, Horace A., III.<br/>Preferred Shelf Number RC963.4 .B86 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119272298">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119272298</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Emergency Triage of the Horse.ent://SD_ILS/0/SD_ILS:6004052026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Radcliffe, Rolfe M. Kopper, Jamie J.<br/>Preferred Shelf Number XX(600405.1)<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817673">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119817673</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>State estimation of multi-agent vehicle-road interaction systemsent://SD_ILS/0/SD_ILS:6003432026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Wang, Yan, author. Yin, Guodong, author. Huang, Chao, author.<br/>Preferred Shelf Number TE228.3 .W36 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394293407">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394293407</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Polypropylene cable insulationent://SD_ILS/0/SD_ILS:5995132026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Du, Boxue, 1961- author. Li, Zhonglei, author.<br/>Preferred Shelf Number TK3351 .D75 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394234462">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394234462</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Smart cyber-physical power systems : fundamental concepts, challenges, and solutions. Volume 1ent://SD_ILS/0/SD_ILS:5996132026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Parizad, Ali, editor. Baghaee, Hamid Reza, editor. Rahman, Saifur, editor.<br/>Preferred Shelf Number TJ213 .S485 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394191529">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394191529</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Hypersonic slender body aerodynamicsent://SD_ILS/0/SD_ILS:5996462026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Rathakrishnan, Ethirajan, author.<br/>Preferred Shelf Number TL571.5 .R38 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394285662">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394285662</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The analytical chemistry laboratory companionent://SD_ILS/0/SD_ILS:5999672026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Holloway, Michael D., author.<br/>Preferred Shelf Number QD75.22 .H65 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394355150">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394355150</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Materials and processes used in aircraft constructionent://SD_ILS/0/SD_ILS:5999722026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Fink, Johannes Karl, author.<br/>Preferred Shelf Number TL698 .F56 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394313990">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394313990</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Generalized Linear Models : Problems with Censored, Missing, and Zero-Inflated Data.ent://SD_ILS/0/SD_ILS:6000222026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Dupuy, Jean-Francois.<br/>Preferred Shelf Number QA279<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394388455">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394388455</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Permutation tests for complex data : theory, applications and softwareent://SD_ILS/0/SD_ILS:6000332026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Pesarin, Fortunato, author. Salmaso, Luigi, author.<br/>Preferred Shelf Number QA277 .P374 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119438199">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119438199</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advanced vehicle scanning method bridge modal parameter identificationent://SD_ILS/0/SD_ILS:6000702026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Xu, Hao (Computer scientist), author. Yang, Der-Shen, author. Yang, Yeong-Bin, author.<br/>Preferred Shelf Number TG305<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286065">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394286065</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The wheel of time and philosophy : a portion of wisdoment://SD_ILS/0/SD_ILS:6001122026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Held, Jacob M., 1977- editor.<br/>Preferred Shelf Number PS3560 .O7617<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119932437">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119932437</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Blockchain Application Security How to Design Secure and Attack Resilient Blockchain Applications.ent://SD_ILS/0/SD_ILS:6001742026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Morana, Marco. Singh, Harpreet. Piccoli, Francesco.<br/>Preferred Shelf Number QA76.9 .B56<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551065">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119551065</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Modeling and Optimization of Food and Bio-Processes.ent://SD_ILS/0/SD_ILS:6003032026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Trystram, Gille. Trelea, Cristian.<br/>Preferred Shelf Number XX(600303.1)<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394423613">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394423613</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of VHDL for FPGA programming using Vivadoent://SD_ILS/0/SD_ILS:6003132026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Pakdel, Majid, author.<br/>Preferred Shelf Number TK7885.7<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394343126">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394343126</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>COMMUNICATION SKILLS FOR YOUR POLICING DEGREEent://SD_ILS/0/SD_ILS:5718322026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Bottomley, Jane (Senior language tutor), auteur. Pryjmachuk, Steven, 1964- author. Wright, Martin, Dr., author.<br/>Preferred Shelf Number HV7936 .C8<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781041054658">https://www.taylorfrancis.com/books/9781041054658</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Intelligent scheduling of tasks for cloud-edge-device computing systemsent://SD_ILS/0/SD_ILS:6003582026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Hu, Biao, author.<br/>Preferred Shelf Number QA76.585 .H83 2025<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394361656">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394361656</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CompTIA DataSys+ study guide : exam DSO-001ent://SD_ILS/0/SD_ILS:5986642026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Chapple, Mike, 1975- author. Nijim, Sharif, author.<br/>Preferred Shelf Number QA76.3 .C43 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394277094">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394277094</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Sodium-ion batteries : technologies and applicationsent://SD_ILS/0/SD_ILS:5987112026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Ji, Xiaobo, editor. Hou, Hongshuai, editor. Zou, Guoqiang, editor.<br/>Preferred Shelf Number TK2945 .S62 S63 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527841684">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527841684</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Intelligent surfaces empowered 6G wireless networkent://SD_ILS/0/SD_ILS:5987182026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Wu, Qingqing (Professor), author.<br/>Preferred Shelf Number TA418.7 .W9 2024 EB<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119913122">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119913122</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The first steps of lifeent://SD_ILS/0/SD_ILS:5988612026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Di Mauro, Ernesto, 1945- editor.<br/>Preferred Shelf Number QH325<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394264155">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394264155</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Thermal management materials for electronic packaging : preparation, characterization, and devicesent://SD_ILS/0/SD_ILS:5988712026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Tian, Xingyou, editor.<br/>Preferred Shelf Number TK7870.15<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527843121">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527843121</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Machine Learning Theory and Applications : Hands-On Use Cases with Python on Classical and Quantum Machines.ent://SD_ILS/0/SD_ILS:5988842026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Vasques, Xavier.<br/>Preferred Shelf Number Q325.5<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394220649">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394220649</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in aerial sensing and imagingent://SD_ILS/0/SD_ILS:5989022026-02-22T09:24:37Z2026-02-22T09:24:37ZAuthor Kumar, Sandeep, editor.<br/>Preferred Shelf Number TK8315 .A38 2024<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394175512">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394175512</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>