Search Results for Test. - Narrowed by: Online LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTest.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026ps$003d300?dt=list2026-04-11T23:56:47ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Preferred Shelf Number R834.5<br/>Electronic Access Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Lowenthal, Michael. Project Muse.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Dietel, Ron. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Aquifer test modelingent://SD_ILS/0/SD_ILS:5450382026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Walton, William Clarence., author.<br/>Preferred Shelf Number GB1199 .W345 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420042931">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>The Turing test argumentent://SD_ILS/0/SD_ILS:5781672026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Gonçalves, Bernardo, author.<br/>Preferred Shelf Number Q341 .G66 2024<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003300267">https://www.taylorfrancis.com/books/9781003300267</a>
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OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design A Self-Test, Self-Diagnosis, and Self-Repair-Based Approachent://SD_ILS/0/SD_ILS:5202912026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Li, Xiaowei. author. Yan, Guihai. author. Liu, Cheng. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-8551-5">https://doi.org/10.1007/978-981-19-8551-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software Testing Automation Testability Evaluation, Refactoring, Test Data Generation and Fault Localizationent://SD_ILS/0/SD_ILS:5203772026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Parsa, Saeed. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-22057-9">https://doi.org/10.1007/978-3-031-22057-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Educational accountability and American federalism : moving beyond a test-based approachent://SD_ILS/0/SD_ILS:5810632026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Portz, John, 1953- author.<br/>Preferred Shelf Number LB2806.22<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003276890">https://www.taylorfrancis.com/books/9781003276890</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Testing of Materials for Fire Protection Needs European Standard Test Methods for the Building Sectorent://SD_ILS/0/SD_ILS:5275692026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Makovická Osvaldová, Linda. author. Fatriasari, Widya. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-39711-0">https://doi.org/10.1007/978-3-031-39711-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>SYSTEMATICALLY ANALYSING INDIRECT TRANSLATIONS putting the concatenation effect hypothesis to... the test.ent://SD_ILS/0/SD_ILS:5670642026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Hadley, James (Researcher in literary translation), author.<br/>Preferred Shelf Number P306.97 .I53<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429282768">https://www.taylorfrancis.com/books/9780429282768</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>British nuclear weapons and the test ban : squaring the circle of defence and arms control, 1974-82ent://SD_ILS/0/SD_ILS:5773322026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Walker, John R., 1960- author.<br/>Preferred Shelf Number U264.5 .G7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003375708">https://www.taylorfrancis.com/books/9781003375708</a>
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OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pregnancy, delivery, childbirth : a gender and cultural history from antiquity to the test tube in Europeent://SD_ILS/0/SD_ILS:5641672026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Filippini, Nadia Maria, author. Boscolo, Clelia, translator.<br/>Preferred Shelf Number RG511 .F4513 2021<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429265457">https://www.taylorfrancis.com/books/9780429265457</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>SIGNAL DETECTION FOR MEDICAL SCIENTISTS; LIKELIHOOD RATIO TEST-BASED METHODOLOGYent://SD_ILS/0/SD_ILS:5545052026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Tiwari, Ram (Ram C.), author. Zalkikar, Jyoti, author. Huang, Lan (Statistician), author.<br/>Preferred Shelf Number RM301.27<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429259753">https://www.taylorfrancis.com/books/9780429259753</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pluralism, poetry, and literacy : a test of reading and interpretive techniquesent://SD_ILS/0/SD_ILS:5709572026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Kalck, Xavier, author.<br/>Preferred Shelf Number PN81 .K24 2021<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429200786">https://www.taylorfrancis.com/books/9780429200786</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>PSYCHOMETRICS OF STANDARD SETTING connecting policy and test scores.ent://SD_ILS/0/SD_ILS:5844652026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Reckase, Mark.<br/>Preferred Shelf Number BF39<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429156410">https://www.taylorfrancis.com/books/9780429156410</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A democratic theory of educational credibility : from test-based assessment to interpersonal responsibilityent://SD_ILS/0/SD_ILS:5583472026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Gottlieb, Derek, author.<br/>Preferred Shelf Number LB2806.22 .G68 2020 EB<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429019159">https://www.taylorfrancis.com/books/9780429019159</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Validity an integrated approach to test score meaning and useent://SD_ILS/0/SD_ILS:5825712026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Cizek, Gregory J.<br/>Preferred Shelf Number LB3060.7<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429291661">https://www.taylorfrancis.com/books/9780429291661</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papersent://SD_ILS/0/SD_ILS:4835822026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-5950-7">https://doi.org/10.1007/978-981-13-5950-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Diagnostic Test Accuracy Studies in Dementia A Pragmatic Approachent://SD_ILS/0/SD_ILS:4844092026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Larner, A. J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-17562-7">https://doi.org/10.1007/978-3-030-17562-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test Generation of Crosstalk Delay Faults in VLSI Circuitsent://SD_ILS/0/SD_ILS:4844152026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniquesent://SD_ILS/0/SD_ILS:4848842026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink 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(orcid)0000-0002-6659-4126 SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-85012-7">https://doi.org/10.1007/978-3-031-85012-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cyberspace Simulation and Evaluation Third International Conference, CSE 2024, Shenzhen, China, November 26-28, 2024, Proceedings, Part IIIent://SD_ILS/0/SD_ILS:6083092026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Xu, Guangxia. editor. (orcid)0000-0002-5866-4315 Zhou, Wanlei. editor. (orcid)0000-0002-1680-2521 Zhang, Jiawei. editor. (orcid)0000-0001-8812-4961 Zhang, Yanchun. editor. 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(orcid)0000-0003-1318-8973 Junges, Sebastian. editor. (orcid)0000-0003-0978-8466 Kaminski, Benjamin Lucien. editor. (orcid)0000-0001-5185-2324 Matheja, Christoph. editor. (orcid)0000-0001-9151-0441 Noll, Thomas. editor. (orcid)0000-0002-1865-1798<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-75778-5">https://doi.org/10.1007/978-3-031-75778-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fostering Machine Learning and IoT for Blockchain Technology Smart Cities Applications, Volume 2ent://SD_ILS/0/SD_ILS:6091922026-04-11T23:56:47Z2026-04-11T23:56:47ZAuthor Ahmad, Khaleel. editor. Dulhare, Uma N. editor. Badar, Mohammad Sufian. editor. Ahamed, Jameel. editor. Rizvi, M. 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