Search Results for Test. - Narrowed by: Electronic LibrarySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTest.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253AELEKKUTUPH$002509Electronic$002bLibrary$0026ps$003d300?dt=list2026-06-15T02:08:54ZSituational judgement testent://SD_ILS/0/SD_ILS:5123852026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Metcalfe, David (Physician), author. Dev, Harveer, author.<br/>Preferred Shelf Number R834.5<br/>Electronic Access Oxford scholarship online <a href="https://dx.doi.org/10.1093/oso/9780198805809.001.0001">https://dx.doi.org/10.1093/oso/9780198805809.001.0001</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The paternity testent://SD_ILS/0/SD_ILS:2419382026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Lowenthal, Michael. Project Muse.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://muse.jhu.edu/books/9780299290030/">Full text available: </a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Perfect Testent://SD_ILS/0/SD_ILS:2068082026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Dietel, Ron. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-6091-478-2">http://dx.doi.org/10.1007/978-94-6091-478-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Türkisch-Artikulations-Test (TAT)ent://SD_ILS/0/SD_ILS:1907452026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Nas, Vasfi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03812-9">http://dx.doi.org/10.1007/978-3-642-03812-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nurses! test yourself in pathophysiologyent://SD_ILS/0/SD_ILS:2785562026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Rogers, Katherine M. 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Studying a study and testing a test. Ovid Technologies, Inc.<br/>Preferred Shelf Number ONLINE(321406.1)<br/>Electronic Access <a href="http://ovidsp.ovid.com/ovidweb.cgi?T=JS&PAGE=booktext&NEWS=N&DF=bookdb&AN=01787340/6th_Edition&XPATH=/PG(0)">Authentication may be required:</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Cutaneous Cytology and Tzanck Smear Testent://SD_ILS/0/SD_ILS:4844962026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Durdu, Murat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-10722-2">https://doi.org/10.1007/978-3-030-10722-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>High-Voltage Test and Measuring Techniquesent://SD_ILS/0/SD_ILS:4853322026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Hauschild, Wolfgang. author. Lemke, Eberhard. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic 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McGraw-Hill's SAT II chemistry.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/mcgrawhills-sat-subject-test-chemistry-2ed">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>VLSI Design and Test for Systems Dependabilityent://SD_ILS/0/SD_ILS:4837112026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CMOS Test and Evaluation A Physical Perspectiveent://SD_ILS/0/SD_ILS:5303292026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nurses! Test Yourself In Non-Medical Prescribingent://SD_ILS/0/SD_ILS:2798342026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Harris, Noel. Shearer, Diane.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=524783</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Test and Diagnosis for Small-Delay Defectsent://SD_ILS/0/SD_ILS:1731082026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-8297-1">http://dx.doi.org/10.1007/978-1-4419-8297-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Design Driven Testing Test Smarter, Not 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Bridging Research and Practice from Motor Control to Handwriting Analysis and Recognition 21st International Conference of the International Graphonomics Society, IGS 2023, Évora, Portugal, October 16-19, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5214042026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Parziale, Antonio. editor. Diaz, Moises. editor. Melo, Filipe. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-45461-5">https://doi.org/10.1007/978-3-031-45461-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Proceedings of the 2021 Asia-Pacific International Symposium on Aerospace Technology (APISAT 2021), Volume 1ent://SD_ILS/0/SD_ILS:5267712026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Lee, Sangchul. editor. Han, Cheolheui. editor. Choi, Jeong-Yeol. editor. Kim, Seungkeun. editor. Kim, Jeong Ho. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-2689-1">https://doi.org/10.1007/978-981-19-2689-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Emerging Technologies in Data Mining and Information Security Proceedings of IEMIS 2022, Volume 3ent://SD_ILS/0/SD_ILS:5268852026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Dutta, Paramartha. editor. Bhattacharya, Abhishek. editor. Dutta, Soumi. editor. Lai, Wen-Cheng. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-4676-9">https://doi.org/10.1007/978-981-19-4676-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Proceedings of I4SDG Workshop 2023 IFToMM for Sustainable Development Goalsent://SD_ILS/0/SD_ILS:5269692026-06-15T02:08:54Z2026-06-15T02:08:54ZAuthor Petuya, Victor. editor. Quaglia, Giuseppe. editor. 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