Search Results for Test. - Narrowed by: Electronic circuits.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTest.$0026qf$003dSUBJECT$002509Subject$002509Electronic$002bcircuits.$002509Electronic$002bcircuits.$0026ps$003d300$0026isd$003dtrue?dt=list
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VLSI Design and Test for Systems Dependability
ent://SD_ILS/0/SD_ILS:483711
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Author Asai, Shojiro. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-4-431-56594-9">https://doi.org/10.1007/978-4-431-56594-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CMOS Test and Evaluation A Physical Perspective
ent://SD_ILS/0/SD_ILS:530329
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Author Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
ent://SD_ILS/0/SD_ILS:486411
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Author Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Test Generation of Crosstalk Delay Faults in VLSI Circuits
ent://SD_ILS/0/SD_ILS:484415
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Author Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-13-2493-2">https://doi.org/10.1007/978-981-13-2493-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniques
ent://SD_ILS/0/SD_ILS:484884
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Author Li, Zipeng. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. Lee, Chen-Yi. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs
ent://SD_ILS/0/SD_ILS:487405
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Author Noia, Brandon. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The science of sound recording
ent://SD_ILS/0/SD_ILS:267103
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Author Kadis, Jay. Brown, Pat, 1957- Test and measurement.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9780240823645">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Cloud Computing with Security and Scalability. Concepts and Practices
ent://SD_ILS/0/SD_ILS:526775
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Author Sehgal, Naresh Kumar. author. Bhatt, Pramod Chandra P. author. Acken, John M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-07242-0">https://doi.org/10.1007/978-3-031-07242-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Electronic Devices, Circuits and Systems Select Proceedings of EEDCS Workshop Held in Conjunction with ISDCS 2022
ent://SD_ILS/0/SD_ILS:526856
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Author Giri, Chandan. editor. Iizuka, Takahiro. editor. Rahaman, Hafizur. editor. Bhattacharya, Bhargab B. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-0055-8">https://doi.org/10.1007/978-981-99-0055-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Machine Learning Support for Fault Diagnosis of System-on-Chip
ent://SD_ILS/0/SD_ILS:527527
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Author Girard, Patrick. editor. Blanton, Shawn. editor. Wang, Li-C. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-19639-3">https://doi.org/10.1007/978-3-031-19639-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
ent://SD_ILS/0/SD_ILS:530077
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Author Qu, Shichun. author. Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1556-9">https://doi.org/10.1007/978-1-4939-1556-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
ent://SD_ILS/0/SD_ILS:530324
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Author Ohnhäuser, Frank. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-47020-6">https://doi.org/10.1007/978-3-662-47020-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Application of Evolutionary Algorithms for Multi-objective Optimization in VLSI and Embedded Systems
ent://SD_ILS/0/SD_ILS:529630
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Author Bhuvaneswari, M.C. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-81-322-1958-3">https://doi.org/10.1007/978-81-322-1958-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Counterfeit Integrated Circuits Detection and Avoidance
ent://SD_ILS/0/SD_ILS:530174
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Author Tehranipoor, Mark (Mohammad). author. Guin, Ujjwal. author. Forte, Domenic. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-11824-6">https://doi.org/10.1007/978-3-319-11824-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>