Search Results for Test. - Narrowed by: Electronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTest.$0026qf$003dSUBJECT$002509Subject$002509Electronics.$002509Electronics.$0026ps$003d300?
2025-12-26T19:15:48Z
Microelectronic Test Structures for CMOS Technology
ent://SD_ILS/0/SD_ILS:173193
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Author Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-9377-9">http://dx.doi.org/10.1007/978-1-4419-9377-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Integrated Circuit Test Engineering Modern Techniques
ent://SD_ILS/0/SD_ILS:175290
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Author Grout, Ian A. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-173-3">http://dx.doi.org/10.1007/1-84628-173-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
CMOS Test and Evaluation A Physical Perspective
ent://SD_ILS/0/SD_ILS:530329
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Author Bhushan, Manjul. author. Ketchen, Mark B. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1349-7">https://doi.org/10.1007/978-1-4939-1349-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Test Pattern Generation using Boolean Proof Engines
ent://SD_ILS/0/SD_ILS:204765
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Author Drechsler, Rolf. author. Eggersglüβ, Stephan. author. Fey, Görschwin. author. Tille, Daniel. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-2360-5">http://dx.doi.org/10.1007/978-90-481-2360-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Emerging Nanotechnologies Test, Defect Tolerance, and Reliability
ent://SD_ILS/0/SD_ILS:167204
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Author Tehranipoor, Mohammad. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-74747-7">http://dx.doi.org/10.1007/978-0-387-74747-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Oscillation-Based Test in Mixed-Signal Circuits
ent://SD_ILS/0/SD_ILS:169432
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Author Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-5315-0">http://dx.doi.org/10.1007/1-4020-5315-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test
ent://SD_ILS/0/SD_ILS:486411
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Author Chandrasekharan, Arun. author. Große, Daniel. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Critical mm-Wave Components for Synthetic Automatic Test Systems
ent://SD_ILS/0/SD_ILS:529644
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Author Hrobak, Michael. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-658-09763-9">https://doi.org/10.1007/978-3-658-09763-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
ent://SD_ILS/0/SD_ILS:331265
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Author Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(331265.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
High Quality Test Pattern Generation and Boolean Satisfiability
ent://SD_ILS/0/SD_ILS:173360
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Author Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-9976-4">http://dx.doi.org/10.1007/978-1-4419-9976-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Accelerating Test, Validation and Debug of High Speed Serial Interfaces
ent://SD_ILS/0/SD_ILS:205484
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Author Fan, Yongquan. author. Zilic, Zeljko. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-9398-1">http://dx.doi.org/10.1007/978-90-481-9398-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Low-Power High-Resolution Analog to Digital Converters Design, Test and Calibration
ent://SD_ILS/0/SD_ILS:205572
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Author Zjajo, Amir. author. Pineda de Gyvez, José. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-90-481-9725-5">http://dx.doi.org/10.1007/978-90-481-9725-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
RF MEMS Switches and Integrated Switching Circuits Design, Fabrication, and Test
ent://SD_ILS/0/SD_ILS:166333
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Author Liu, Ai-Qun. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-46262-2">http://dx.doi.org/10.1007/978-0-387-46262-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
ent://SD_ILS/0/SD_ILS:169826
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Author Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-6488-3">http://dx.doi.org/10.1007/978-1-4020-6488-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Test- und Prüfungsaufgaben Regelungstechnik 457 durchgerechnete Beispiele mit analytischen, nummerischen und computeralgebraischen Lösungen in MATLAB und MAPLE
ent://SD_ILS/0/SD_ILS:176933
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Author Weinmann, Alexander. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-211-37139-8">http://dx.doi.org/10.1007/978-3-211-37139-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design of Systems on a Chip: Design and Test
ent://SD_ILS/0/SD_ILS:165857
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Author Reis, Ricardo. editor. Lubaszewski, Marcelo. editor. Jess, Jochen A.G. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-32500-X">http://dx.doi.org/10.1007/0-387-32500-X</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Core Test Wrapper Handbook Rationale and Application of IEEE Std. 1500™
ent://SD_ILS/0/SD_ILS:166049
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Author Silva, Francisco. author. McLaurin, Teresa. author. Waayers, Tom. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/0-387-34609-0">http://dx.doi.org/10.1007/0-387-34609-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
System-level Test and Validation of Hardware/Software Systems
ent://SD_ILS/0/SD_ILS:175272
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Author Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Introduction to Advanced System-on-Chip Test Design and Optimization
ent://SD_ILS/0/SD_ILS:165162
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Author Larsson, Erik. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b135763">http://dx.doi.org/10.1007/b135763</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advancement of Optical Methods in Experimental Mechanics, Volume 3 Proceedings of the 2014 Annual Conference on Experimental and Applied Mechanics
ent://SD_ILS/0/SD_ILS:530446
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Author Jin, Helena. editor. Sciammarella, Cesar. editor. Yoshida, Sanichiro. editor. Lamberti, Luciano. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-06986-9">https://doi.org/10.1007/978-3-319-06986-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Wafer-Level Chip-Scale Packaging Analog and Power Semiconductor Applications
ent://SD_ILS/0/SD_ILS:530077
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Author Qu, Shichun. author. Liu, Yong. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4939-1556-9">https://doi.org/10.1007/978-1-4939-1556-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Analog-Digital Converters for Industrial Applications Including an Introduction to Digital-Analog Converters
ent://SD_ILS/0/SD_ILS:530324
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Author Ohnhäuser, Frank. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-47020-6">https://doi.org/10.1007/978-3-662-47020-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>