Search Results for Test. - Narrowed by: Microprocessors. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTest.$0026qf$003dSUBJECT$002509Subject$002509Microprocessors.$002509Microprocessors.$0026ps$003d300? 2024-11-14T04:46:53Z Design Automation Techniques for Approximation Circuits Verification, Synthesis and Test ent://SD_ILS/0/SD_ILS:486411 2024-11-14T04:46:53Z 2024-11-14T04:46:53Z Author&#160;Chandrasekharan, Arun. author.&#160;Gro&szlig;e, Daniel. author.&#160;Drechsler, Rolf. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-98965-5">https://doi.org/10.1007/978-3-319-98965-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Micro-Electrode-Dot-Array Digital Microfluidic Biochips Design Automation, Optimization, and Test Techniques ent://SD_ILS/0/SD_ILS:484884 2024-11-14T04:46:53Z 2024-11-14T04:46:53Z Author&#160;Li, Zipeng. author.&#160;Chakrabarty, Krishnendu. author.&#160;Ho, Tsung-Yi. author.&#160;Lee, Chen-Yi. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-030-02964-7">https://doi.org/10.1007/978-3-030-02964-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design-for-Test and Test Optimization Techniques for TSV-based 3D Stacked ICs ent://SD_ILS/0/SD_ILS:487405 2024-11-14T04:46:53Z 2024-11-14T04:46:53Z Author&#160;Noia, Brandon. author.&#160;Chakrabarty, Krishnendu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-02378-6">https://doi.org/10.1007/978-3-319-02378-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>