Search Results for Test. - Narrowed by: Processor Architectures. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTest.$0026qf$003dSUBJECT$002509Subject$002509Processor$002bArchitectures.$002509Processor$002bArchitectures.$0026ps$003d300?dt=list 2026-03-13T23:46:48Z VLSI Design and Test 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers ent://SD_ILS/0/SD_ILS:613347 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Kaushik, Brajesh Kumar. editor.&#160;Dasgupta, Sudeb. editor.&#160;Singh, Virendra. editor. (orcid)0000-0002-9113-5167&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-10-7470-7">https://doi.org/10.1007/978-981-10-7470-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers ent://SD_ILS/0/SD_ILS:335156 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Gaur, Manoj Singh. editor.&#160;Zwolinski, Mark. editor.&#160;Laxmi, Vijay. editor.&#160;Boolchandani, Dharmendra. editor.&#160;Sing, Virendra. editor.<br/>Preferred Shelf Number&#160;ONLINE(335156.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-42024-5">http://dx.doi.org/10.1007/978-3-642-42024-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System-Level Validation High-Level Modeling and Directed Test Generation Techniques ent://SD_ILS/0/SD_ILS:331265 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Chen, Mingsong. author.&#160;Qin, Xiaoke. author.&#160;Koo, Heon-Mo. author.&#160;Mishra, Prabhat. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(331265.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1359-2">http://dx.doi.org/10.1007/978-1-4614-1359-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of Computer Architecture ent://SD_ILS/0/SD_ILS:606621 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Chattopadhyay, Anupam. editor. (orcid)0000-0002-8818-6983&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-97-9314-3">https://doi.org/10.1007/978-981-97-9314-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integrated Circuit Design Tape-out Process with Open-Source Tools ent://SD_ILS/0/SD_ILS:608451 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Ortega Cisneros, Susana. author.&#160;Baungarten Leon, Emilio Isaac. author. (orcid)0000-0001-6243-219X&#160;Mejia Alvarez, Pedro. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-92108-7">https://doi.org/10.1007/978-3-031-92108-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Towards Heterogeneous Multi-core Systems-on-Chip for Edge Machine Learning Journey from Single-core Acceleration to Multi-core Heterogeneous Systems ent://SD_ILS/0/SD_ILS:601747 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Jain, Vikram. author. (orcid)0000-0002-1267-1683&#160;Verhelst, Marian. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-38230-7">https://doi.org/10.1007/978-3-031-38230-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Machine Learning Support for Fault Diagnosis of System-on-Chip ent://SD_ILS/0/SD_ILS:527527 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Girard, Patrick. editor.&#160;Blanton, Shawn. editor.&#160;Wang, Li-C. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-031-19639-3">https://doi.org/10.1007/978-3-031-19639-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Dark Side of Silicon Energy Efficient Computing in the Dark Silicon Era ent://SD_ILS/0/SD_ILS:611677 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Rahmani, Amir M. editor.&#160;Liljeberg, Pasi. editor.&#160;Hemani, Ahmed. editor.&#160;Jantsch, Axel. editor.&#160;Tenhunen, Hannu. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-31596-6">https://doi.org/10.1007/978-3-319-31596-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> More-than-Moore 2.5D and 3D SiP Integration ent://SD_ILS/0/SD_ILS:612808 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Radojcic, Riko. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-52548-8">https://doi.org/10.1007/978-3-319-52548-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Hardware Security and Trust Design and Deployment of Integrated Circuits in a Threatened Environment ent://SD_ILS/0/SD_ILS:616798 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Sklavos, Nicolas. editor.&#160;Chaves, Ricardo. editor.&#160;Di Natale, Giorgio. editor.&#160;Regazzoni, Francesco. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-44318-8">https://doi.org/10.1007/978-3-319-44318-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Testing of Interposer-Based 2.5D Integrated Circuits ent://SD_ILS/0/SD_ILS:616892 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Wang, Ran. author.&#160;Chakrabarty, Krishnendu. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-54714-5">https://doi.org/10.1007/978-3-319-54714-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Boundary-Scan Handbook ent://SD_ILS/0/SD_ILS:614731 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Parker, Kenneth P. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-01174-5">https://doi.org/10.1007/978-3-319-01174-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Counterfeit Integrated Circuits Detection and Avoidance ent://SD_ILS/0/SD_ILS:530174 2026-03-13T23:46:48Z 2026-03-13T23:46:48Z Author&#160;Tehranipoor, Mark (Mohammad). author.&#160;Guin, Ujjwal. author.&#160;Forte, Domenic. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-11824-6">https://doi.org/10.1007/978-3-319-11824-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>