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SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTest.$0026qf$003dSUBJECT$002509Subject$002509Software$002bengineering.$002509Software$002bengineering.$0026ps$003d300? 2025-12-24T18:53:26Z Yaz&#305;l&#305;m test m&uuml;hendisinin el kitab&#305; ent://SD_ILS/0/SD_ILS:514350 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;G&uuml;rb&uuml;z, Ali.<br/>Preferred Shelf Number&#160;QA76.758 G87 2022<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Yaz&#305;l&#305;m test m&uuml;hendisinin el kitab&#305; ent://SD_ILS/0/SD_ILS:479539 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;G&uuml;rb&uuml;z, Ali.<br/>Preferred Shelf Number&#160;QA76.758 G87 2020<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Automatic Generation of Combinatorial Test Data ent://SD_ILS/0/SD_ILS:489313 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Zhang, Jian. author.&#160;Zhang, Zhiqiang. author.&#160;Ma, Feifei. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-662-43429-1">https://doi.org/10.1007/978-3-662-43429-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Test and Analysis of Web Services ent://SD_ILS/0/SD_ILS:186686 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Baresi, Luciano. editor.&#160;Nitto, Elisabetta Di. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-72912-9">http://dx.doi.org/10.1007/978-3-540-72912-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A Study Guide to the ISTQB&reg; Foundation Level 2018 Syllabus Test Techniques and Sample Mock Exams ent://SD_ILS/0/SD_ILS:399773 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Roman, Adam. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-98740-8">https://doi.org/10.1007/978-3-319-98740-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Qualit&auml;tssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmen ent://SD_ILS/0/SD_ILS:338309 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Kleuker, Stephan. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(338309.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-8348-2068-6">http://dx.doi.org/10.1007/978-3-8348-2068-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings ent://SD_ILS/0/SD_ILS:197090 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Rahaman, Hafizur. editor.&#160;Chattopadhyay, Sanatan. editor.&#160;Chattopadhyay, Santanu. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-31494-0">http://dx.doi.org/10.1007/978-3-642-31494-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerating Test, Validation and Debug of High Speed Serial Interfaces ent://SD_ILS/0/SD_ILS:205484 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Fan, Yongquan. author.&#160;Zilic, Zeljko. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-90-481-9398-1">http://dx.doi.org/10.1007/978-90-481-9398-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Test-Driven Development An Empirical Evaluation of Agile Practice ent://SD_ILS/0/SD_ILS:190899 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Madeyski, Lech. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-04288-1">http://dx.doi.org/10.1007/978-3-642-04288-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The Testing Network An Integral Approach to Test Activities in Large Software Projects ent://SD_ILS/0/SD_ILS:188154 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Henry, Pierre. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-78504-0">http://dx.doi.org/10.1007/978-3-540-78504-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Data structure and software engineering : challenges and improvements ent://SD_ILS/0/SD_ILS:539709 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Antonakos, James L.<br/>Preferred Shelf Number&#160;QA76.9 .D35 D38 2011<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781466562608">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Computers, Software Engineering, and Digital Devices ent://SD_ILS/0/SD_ILS:542493 2025-12-24T18:53:26Z 2025-12-24T18:53:26Z Author&#160;Dorf, Richard C., author.&#160;Taylor and Francis.<br/>Preferred Shelf Number&#160;TK7885<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420037050">Click here to view.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>