Search Results for Testen. - Narrowed by: Online Library SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesten.$0026qf$003dLIBRARY$002509Library$0025091$00253AONLINE$002509Online$002bLibrary$0026pe$003dd$00253A$0026ps$003d300? 2025-03-15T11:23:17Z Testen von Informationssystemen Integriertes und prozessorientiertes Testen ent://SD_ILS/0/SD_ILS:199184 2025-03-15T11:23:17Z 2025-03-15T11:23:17Z Author&#160;Pilorget, Lionel. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-8348-8677-4">http://dx.doi.org/10.1007/978-3-8348-8677-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Car Multimedia Systeme Modell-basiert testen mit SysML ent://SD_ILS/0/SD_ILS:199678 2025-03-15T11:23:17Z 2025-03-15T11:23:17Z Author&#160;Alt, Oliver. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-8348-9567-7">http://dx.doi.org/10.1007/978-3-8348-9567-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software-Qualit&auml;t Testen, Analysieren und Verifizieren von Software ent://SD_ILS/0/SD_ILS:198697 2025-03-15T11:23:17Z 2025-03-15T11:23:17Z Author&#160;Liggesmeyer, Peter. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-8274-2203-3">http://dx.doi.org/10.1007/978-3-8274-2203-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbuch zum Testen von Web-Applikationen Testverfahren, Werkzeuge, Praxistipps ent://SD_ILS/0/SD_ILS:185391 2025-03-15T11:23:17Z 2025-03-15T11:23:17Z Author&#160;Franz, Klaus. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-68185-4">http://dx.doi.org/10.1007/978-3-540-68185-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> VLSI test principles and architectures design for testability ent://SD_ILS/0/SD_ILS:253779 2025-03-15T11:23:17Z 2025-03-15T11:23:17Z Author&#160;Wang, Laung-Terng.&#160;Wu, Cheng-Wen, EE Ph. D.&#160;Wen, Xiaoqing.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Assessing Speaking ent://SD_ILS/0/SD_ILS:236742 2025-03-15T11:23:17Z 2025-03-15T11:23:17Z Author&#160;Luoma, Sari.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1017/CBO9780511733017">Access by subscription</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Digital circuit testing a guide to DFT and other techniques ent://SD_ILS/0/SD_ILS:255234 2025-03-15T11:23:17Z 2025-03-15T11:23:17Z Author&#160;Wang, Francis C.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>