Search Results for Testen. - Narrowed by: Testen.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dTesten.$0026qf$003dSUBJECT$002509Subject$002509Testen.$002509Testen.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-01-14T13:41:55Z
VLSI test principles and architectures design for testability
ent://SD_ILS/0/SD_ILS:253779
2026-01-14T13:41:55Z
2026-01-14T13:41:55Z
Author Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123705976">http://www.sciencedirect.com/science/book/9780123705976</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Assessing Speaking
ent://SD_ILS/0/SD_ILS:236742
2026-01-14T13:41:55Z
2026-01-14T13:41:55Z
Author Luoma, Sari.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511733017">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital circuit testing a guide to DFT and other techniques
ent://SD_ILS/0/SD_ILS:255234
2026-01-14T13:41:55Z
2026-01-14T13:41:55Z
Author Wang, Francis C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780127345802">http://www.sciencedirect.com/science/book/9780127345802</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>